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200AC-NA

Probe

  • 8 nm
  • 8 nm
  • < 7 nm
  • 12 - 16 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm
  • Aluminum

Cantilever



Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
Standard silicon cantilever200AC-NA Series 85 135 175 3 9 22 200 40 3.5

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