11 series

XSC11,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 12 15 18 0.1 0.2 0.4 500 30 2.7
Cantilever B 60 80 100 1.1 2.7 5.6 210 30 2.7
Cantilever C 115 155 200 3 7 16 150 30 2.7
Cantilever D 250 350 465 17 42 90 100 50 2.7

Features 1-10 nm Features > 10 nm EFM
HQ:XSC11/Al BS
HQ:XSC11/No Al
HQ:XSC11/Hard/Al BS
HQ:XSC11/Pt
HQ:DPE-XSC11
HQ:DPER-XSC11

ORDERING OPTIONS

Click on a product type below to order online.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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