14 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1

Application

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Scans and application notes

Features < 1 nm Features 1-10 nm Features > 10 nm EFM
Hi'Res-C14/Cr-Au
HQ:NSC14/Al BS
HQ:NSC14/No Al
HQ:NSC14/Hard/Al BS
HQ:NSC14/Cr-Au
HQ:NSC14/Pt

ORDERING OPTIONS

Click on a product type below to order online.

HIGH RESOLUTION

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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