|Cantilever||Resonance Frequency, kHz||Force Constant, N/m||
l ± 5,
w ± 3,
t ± 0.5,
ApplicationCantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.
Scans and application notes
|Features < 1 nm||Features 1-10 nm||Features > 10 nm||EFM|
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Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.