15 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
15 Series 265 325 410 20 40 80 125 30 4.0

Application

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM.

Scans and application notes



Features < 1 nm Features 1-10 nm Features > 10 nm EFM
Hi'Res-C15/Cr-Au
HQ:NSC15/Al BS
HQ:NSC15/No Al
HQ:NSC15/Cr-Au BS
HQ:NSC15/Hard/Al BS
HQ:NSC15/Cr-Au
HQ:NSC15/Pt

ORDERING OPTIONS

Click on a product type below to order online.

HIGH RESOLUTION

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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