16 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
16 Series 170 190 210 30 45 70 225 37.5 7.0

Application

These cantilevers with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM systems that have a low-frequency feedback loop. These cantilevers also fit SPMs that do not support probes with short lever arms.

Scans and application notes

Features 1-10 nm Features > 10 nm EFM
HQ:NSC16/Al BS
HQ:NSC16/No Al
HQ:NSC16/Hard/Al BS
HQ:NSC16/Cr-Au

ORDERING OPTIONS

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GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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