17 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
17 Series 10 13 17 0.06 0.18 0.4 450 50 2.0

Application

Cantilevers of the 17 series with low spring constant are used mostly in contact mode AFM. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of soft samples.

Scans and application notes

Features 1-10 nm Features > 10 nm EFM
HQ:CSC17/Al BS
HQ:CSC17/No Al
HQ:CSC17/Hard/Al BS
HQ:CSC17/Cr-Au
HQ:CSC17/Pt

ORDERING OPTIONS

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GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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