18 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
18 Series 60 75 90 1.2 2.8 5.5 225 27.5 3.0

Application

Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.

Scans and application notes

Features < 1 nm Features 1-10 nm Features > 10 nm EFM MFM
Hi'Res-C18/Cr-Au
HQ:NSC18/Al BS
HQ:NSC18/No Al
HQ:NSC18/Cr-Au BS
HQ:NSC18/Hard/ Al BS
HQ:NSC18/Cr-Au
HQ:NSC18/Pt
HQ:NSC18/Co-Cr/Al BS

ORDERING OPTIONS

Click on a product type below to order online.

HIGH RESOLUTION

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

MAGNETIC

Probes with magnetic coating for MFM.
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