19 series

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
19 Series 25 65 120 0.05 0.5 2.3 125 22.5 1.0

Application

Cantilevers of the 19 series combine high resonance frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in tapping mode. The cantilevers may also be useful in LFM due to their high sensitivity to the lateral forces.

Scans and application notes

Features < 1 nm Features 1-10 nm EFM
Hi'Res-C19/Cr-Au
HQ:NSC19/Al BS
HQ:NSC19/No Al
HQ:NSC19/Cr-Au

ORDERING OPTIONS

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HIGH RESOLUTION

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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