35 series

NSC35,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 130 205 290 2.7 8.9 24 110 35 2.0
Cantilever B 185 300 430 4.8 16 44 90 35 2.0
Cantilever C 95 150 205 1.7 5.4 14 130 35 2.0

Features 1-10 nm Features > 10 nm EFM Tipless
HQ:NSC35/Al BS
HQ:NSC35/No Al
HQ:NSC35/Cr-Au BS
HQ:NSC35/Hard/Al BS
HQ:NSC35/Cr-Au
HQ:NSC35/Pt
HQ:NSC35/tipless/No Al
HQ:NSC35/tipless/Al BS
HQ:NSC35/tipless/Cr-Au

ORDERING OPTIONS

Click on a product type below to order online.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

TIPLESS

Tipless cantilevers for various custom applications such as attaching spheres.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

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