36 series

NSC36,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 30 90 160 0.1 1 4.6 110 32.5 1.0
Cantilever B 45 130 240 0.2 2 9 90 32.5 1.0
Cantilever C 25 65 115 0.06 0.6 2.7 130 32.5 1.0

Features 1-10 nm Features > 10 nm EFM MFM Tipless
HQ:NSC36/Al BS
HQ:NSC36/No Al
HQ:NSC36/Cr-Au BS
HQ:NSC36/Hard/Al BS
HQ:NSC36/Cr-Au
HQ:NSC36/Pt
HQ:NSC36/Co-Cr/Al BS
HQ:NSC36/tipless/No Al
HQ:NSC36/tipless/Al BS
HQ:NSC36/tipless/Cr-Au

ORDERING OPTIONS

Click on a product type below to order online.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

TIPLESS

Tipless cantilevers for various custom applications such as attaching spheres.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.

MAGNETIC

Probes with magnetic coating for MFM.
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