GENERAL PURPOSE AFM PROBES

Application

Most of the routine topography imaging experiments require probes of about 8 to 10 nm radius. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

 Tapping mode topography image of self-assembled structures of semifluorinated alkanes on Si (Agilent 5500 AFM). Scan size 350x350 nm. Scan height 5 nm. The scan is obtained using a General Purpose probe. Image courtesy of S. Magonov, Agilent Technologies.



Probes

hq:nsc probes
The HQ:NSC and HQ:CSC probe tips have trihedral shape. There is a wide range of available cantilever geometries and special coatings for tip and cantilever backside.
  • 8 nm
  • 8 nm
  • < 8 nm
  • 40°
  • 12 - 18 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm

ORDERING OPTIONS

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GENERAL PURPOSE PROBES

Lateral resolution down to
5 nm for scan size below 1 μm.
GENERAL PURPOSE PROBES
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