GENERAL PURPOSE AFM PROBES
Most of the routine topography imaging experiments require probes of about 8 to 10 nm radius. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.
Tapping mode topography image of self-assembled structures of semifluorinated alkanes on Si (Agilent 5500 AFM). Scan size 350x350 nm. Scan height 5 nm. The scan is obtained using a General Purpose probe. Image courtesy of S. Magonov, Agilent Technologies. Probes
The HQ:NSC and HQ:CSC probe tips have trihedral shape. There is a wide range of available cantilever geometries and special coatings for tip and cantilever backside.
Typical probe tip radius of uncoated tip
Typical spike radius
Resulting tip radius with the coating
< 8 nm
Full tip cone angle*
Total tip height
12 - 18 µm
Probe bulk resistivity
0.01 - 0.025 Ohm*cm
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GENERAL PURPOSE PROBES
Lateral resolution down to
5 nm for scan size below 1 μm.