LONG SCANNING AFM PROBES

Application

Long Scanning probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Height image of polystyrene-polybutadiene-polystyrene triblock copolymer. Scan obtained in Tapping mode using LS probe tip with radius about 30 nm. Image courtesy of S. Magonov (Veeco Instuments).

 

Video



Probes

hard probes
HARD probes feature a thin DLC wear-resistant coating that increases the durability. The tip shape is trihedral.
  • 8 nm
  • 8 nm
  • < 20 nm
  • 40°
  • 12 - 18 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm
  • Hard Diamond-Like-Carbon
  • Aluminum

ORDERING OPTIONS

Click on a product type below to order online.

LONG SCANNING PROBES

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
LONG SCANNING PROBES
MIKROMASCH USA
TOLL-FREE NUMBER: + 1-866-SPMTIPS (776-8477)
www.nanoandmore.com/USA
MIKROMASCH EUROPE
PHONE NUMBER: +49 (0) 6441 2003561
www.nanoandmore.com
MikroMasch® is a trademark of Nanoworld AG operated by ISB Ltd.