HQ:NSC18/Pt

Conductive Soft Tapping Mode AFM Probe


AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.

Coating

Electrically Conductive

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 30 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 2.8 N/m(1.2 - 5.5 N/m)* Res. Freq. 75 kHz(60 - 90 kHz)* Length 225 µm(1 - 230µm)* Width 27.5 µm(24.5 - 30.5µm)* Thickness 3µm(2.5 - 3.5 µm)*

* typical values

Packages Price
HQ:NSC18/Pt-15 15 pcs * 395 USD
395 USD
HQ:NSC18/Pt-50 50 pcs * 1120 USD
1120 USD
HQ:NSC18/Pt-100 100 pcs * 2050 USD
2050 USD
* Total: 0 USD
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