DPER (high-resolution)

PROBE

  • 8 nm
  • 8 nm
  • < 20 nm
  • 40°
  • 12 - 18 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm
  • Platinum
  • Platinum
DPER probes are made by depositing a thin platinum coating on silicon tips. While the thickness of the coating on a flat cantilever surface is about 15 nm, there is only a 10 nm increase in the tip dimensions compared to bare silicon probes.

Application

The DPER probes can be used for imaging samples with high resolution in XY directions. Due to the thin coating, the electrical signal may be noisy. One should also not expect coating stability in contact or hard tapping regimes of AFM operation.

Scans and application notes »


4-cantilevers serie(s)

Cantilever Resonance Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
11 series Cantilever A 12 15 18 0.1 0.2 0.4
Cantilever B 60 80 100 1.1 2.7 5.6
Cantilever C 115 155 200 3 7 16
Cantilever D 250 350 465 17 42 90
*The full cone angle may be less than 40° at the last 200 nm of the tip end.

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