DPER probes are made by depositing a thin platinum coating on silicon tips. While the thickness of the coating on a flat cantilever surface is about 15 nm, there is only a 10 nm increase in the tip dimensions compared to bare silicon probes.
< 20 nm
12 - 18 µm
0.01 - 0.025 Ohm*cm
*The full cone angle may be less than 40° at the last 200 nm of the tip end.
The DPER probes can be used for imaging samples with high resolution in XY directions. Due to the thin coating, the electrical signal may be noisy. One should also not expect coating stability in contact or hard tapping regimes of AFM operation.