DPER (high-resolution)

PROBE

DPER probe tip close-up

DPER probes are made by depositing a thin platinum coating on silicon tips. While the thickness of the coating on a flat cantilever surface is about 15 nm, there is only a 10 nm increase in the tip dimensions compared to bare silicon probes.

Typical probe tip radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 20 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Platinum
Detector coating Platinum

*The full cone angle may be less than 40° at the last 200 nm of the tip end.

Application

The DPER probes can be used for imaging samples with high resolution in XY directions. Due to the thin coating, the electrical signal may be noisy. One should also not expect coating stability in contact or hard tapping regimes of AFM operation.

Scans and application notes »

4-cantilevers serie(s)

Cantilever		Resonance Frequency, kHz			Force Constant, N/m
Cantilever		min	typical	max	min	typical	max
11 series	A	12	15	18	0.1	0.2	0.4
	B	60	80	100	1.1	2.7	5.6
	C	115	155	200	3	7	16
	D	250	350	465	17	42	90

OPTIONS

4-lever

11 series 15 - 350 kHz
(0.2 - 42 N/m)
HQ:DPER-XSC11