Pt coated

PROBE

  • 8 nm
  • 8 nm
  • < 30 nm
  • 40°
  • 12 - 18 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm
  • Platinum
  • Platinum

The pyramidal silicon etched probes with an overall conductive platinum coating are suitable for a wide range of electrical AFM applications. The platinum coating is a 30 nm thick film on both sides of the cantilever.

Application

AFM is capable of mapping different electric properties of materials to topography images. These data can be used for analysis of the structure and composition of heterogeneous samples as well as for quantitative characterization of individual grains or defects on surface.

Electric properties of a sample can be mapped using probes with conducting coatings, when AC or DC bias is applied between the tip and the sample. Contact mode or two-pass operation technique can be used for this purpose.

Scans and application notes



1-cantilever serie(s)

Cantilever Resonance Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
14 series 110 160 220 1.8 5.0 13
15 series 265 325 410 20 40 80
17 series 10 13 17 0.06 0.18 0.40
18 series 60 75 90 1.2 2.8 5.5

3-cantilevers serie(s)

Cantilever Resonance Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
35 series Cantilever A 130 205 290 2.7 8.9 24
Cantilever B 185 300 430 4.8 16 44
Cantilever C 95 150 205 1.7 5.4 14
36 series Cantilever A 30 90 160 0.1 1.0 4.6
Cantilever B 45 130 240 0.2 2 9
Cantilever C 25 65 115 0.06 0.6 2.7
37 series Cantilever A 30 40 55 0.3 0.8 2
Cantilever B 15 20 30 0.1 0.3 0.6
Cantilever C 20 30 40 0.1 0.4 1

4-cantilevers serie(s)

Cantilever Resonance Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
11 series Cantilever A 12 15 18 0.1 0.2 0.4
Cantilever B 60 80 100 1.1 2.7 5.6
Cantilever C 115 155 200 3 7 16
Cantilever D 250 350 465 17 42 90
*The full cone angle may be less than 40° at the last 200 nm of the tip end.

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