Conducting DPER probe

Application notes

The DPER probes are made by depositing a thin metal coating on Si tips. While the thickness of the coating on the flat cantilever surface is about 20 nm, there is only slight 4-5 nm increase of the tip dimensions compared to the bare Si probes.

The tip radius of each DPER probe is individually controlled on SEM and is guaranteed to be below 20 nm.

Product Specs

Cantilever tip is coated by continuous 15 nm Pt film.

Detailed specifications »

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