GP is a single-crystal Silicon AFM probe with
tetrahedral tip. The tip is inclined and located at the very end of the
cantilever for easier positioning of the tip into the area of interest using
video camera.
Typical probe tip radius
10 nm
Tip inclination angle
19.5°
Tip aspect ratio
more than 3:1 (4:1 typical)
Tip height
15±2.5 µm
Probe material
p-type silicon (boron doped)
Probe bulk resistivity*
0.01..0.03 Ohm*cm
*The surface of Silicon has a native oxide layer that makes the probe
nonconducting. The thickness of the native oxide film is 1..4 nm.
|
