DP17/LS

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Cantilever
SEM image of Silicon cantilever and probe. Schematic drawing of the probe chip.
Cantilever Resonant Frequency, kHz Spring Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
17 Series 8.5 12 15 0.05 0.15 0.3 460 50 2.0
Probe
SEM image of LS probe tip end.
LS probe features high durability and lifetime due to special wear-resistant coating.

Typical probe tip radius
30 nm

Tip height
20..25 µm

Full tip cone angle
40°

Coating material
Wear-resistant, not conducting, chemically inert.
 
Backside Al-coated.
15 chips. View price
Same day shipment
50 chips. View price
Mix & Match Same day shipment
 
 

 

 

 

 
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