materials characterizing

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Application

Besides surface topography, AFM has been used for mapping of material properties to visualize the distribution of components of composite materials. However, it is still challenging to distinguish between different properties of materials like stiffness, hardness, adhesion, and viscoelasticity on these maps. For the selective quantitative analysis of the properties, a number of specific techniques have been developed.


 

Probes

TL series
 

Cantilevers with torsional sensitivity providing force spectroscopy imaging in tapping mode for mapping of local adhesion and elastic modulus. The probe has a tip that is offset from the long axis of the cantilever. The materials properties can be calculated from the torsional harmonic signal.

Probes with pre-measured spring constant
 

The cantilevers are individually measured at the facility using nondestructive methods of force constant determination. The technique is based on the analysis of cantilever oscillation damping in liquids developed by J. E. Sader (Univ. of Melbourne). The uncertainty of the calibrated value shown in the individual cantilever specifications is about 10 %.

Tipless
 

Cantilevers with attached particles of a well-known size and properies may be used as AFM probes for quantitative measurements of specific interactions. Tipless cantilevers can be useful for mounting particles in the hundreds of nanometer range. For larger particles, there are ways of attaching to cantilevers with tips.


 

Materials Characterizing

Solutions for quantitative analysis of materials properties.

Torsional cantilevers
TL Series

Pre-measured
spring constant
probes
-F Series

Tipless cantilevers
12 Series

 
 

 

 

 

 
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