Most of the routine topography imaging experiments require probes of about 10 nm radius. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Two options are available for this purpose: conventional silicon etched probes and cantilevers with single crystal diamond tip of enhanced durability, sharpness and aspect ratio.
Tapping mode topography image of self-assembled structures of semifluorinated alkanes on Si (Agilent 5500
AFM). Scan size 350x350 nm. Scan height 5 nm.
The scan is obtained using Diamond probe.
Image courtesy of S. Magonov, Agilent Technologies.
Probes
New!
SCD probe is a single crystal Diamond tip mounted to the end of a silicon cantilever. The outstanding properties of diamond make the tip is extremelly durable and chemically stable.
NSC/CSC probe tips have conical shape. There is a wide range of available cantilever shapes and special coatings for tip and cantilever backside.
Typical tip radius 7 nm
Tip aspect ratio better than 4:1
Tip height 5 - 10 μm
Probe material Diamond
Tip inclination angle 19.5°
Typical tip radius 10 nm
Tip cone angle 40°
Tip height 20..25 μm
Probe material n-type Silicon (Phosphorous doped)
general purpose
Lateral resolution down to 5 nm for scan size below 1 μm.