general purpose

Options
Application

Most of the routine topography imaging experiments require probes of about 10 nm radius. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Two options are available for this purpose: conventional silicon etched probes and cantilevers with single crystal diamond tip of enhanced durability, sharpness and aspect ratio.
Tapping mode topography image of self-assembled structures of semifluorinated alkanes on Si (Agilent 5500 AFM). Scan size 350x350 nm. Scan height 5 nm.

The scan is obtained using Diamond probe.

Image courtesy of S. Magonov, Agilent Technologies.

 

Probes

New!
SCD probe is a single crystal Diamond tip mounted to the end of a silicon cantilever. The outstanding properties of diamond make the tip is extremelly durable and chemically stable.
 
NSC/CSC probe tips have conical shape. There is a wide range of available cantilever shapes and special coatings for tip and cantilever backside.

Typical tip radius
7 nm

Tip aspect ratio
better than 4:1

Tip height
5 - 10 μm

Probe material
Diamond

Tip inclination angle
19.5°

Typical tip radius
10 nm

Tip cone angle
40°

Tip height
20..25 μm

Probe material
n-type Silicon (Phosphorous doped)
general purpose

Lateral resolution down to 5 nm for scan size below 1 μm.

New!
7 nm radius diamond tip
SCD

10 nm radius silicon tip
NSC/CSC
 
 

 

 

 

 
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