general purpose

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Application

General purpose probes are designed for routine AFM measurements. Lateral resolution down to 5 nm is attainable for scan size below 1 μm when using the probes.
Topography AFM image of the nanocomposite film on the basis of poly(p-xylylene) matrix and nanoparticles of MoO3 and TiO2. Courtesy of Dr. R. Gaynutdinov (A.V. Shubnikov Institute of crystallography, Moscow).

 

Probes

GP probe is a single-crystal Silicon probe with tertahedral tip. The tip is inclined and located at the very end of the cantilever for easier positioning into the area of interest using video camera. NSC/CSC probe tips have conical shape. There is a wide range of available cantilever shapes and special coatings for tip and cantilever backside.

Typical tip radius
10 nm

Tip aspect ratio
more than 3:1(typical 4:1)

Tip height
15±2.5 μm

Probe material
p-type Silicon (Boron doped)

Tip inclination angle
19.5°

Typical tip radius
10 nm

Tip cone angle
40°

Tip height
20..25 μm

Probe material
n-type Silicon (Phosphorous doped)
general purpose

Lateral resolution down to 5 nm for scan size below 1 μm.

10 nm radius tetrahedral tip
GP

10 nm radius conical tip
NSC/CSC
 
 

 

 

 

 
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