HIGH RESOLUTION

Options
Application

More and more AFM is becoming the tool of choice for non-destructive surface measurements with molecular and sub-molecular resolution. However, the resolution and accuracy of the technique is limited by the size and shape of the tip. In order to increase resolution, it is necessary to both decrease the tip size and the tip-sample interaction force.

The development of the line of HI'RES probes has overcome these obstacles and made higher resolution, sub-nanometer imaging possible. The HI'RES probes allow for more accurate measurement of extremely narrow features such as pores, trenches, and sharp edges, along with accurate measurement of sub-nanometer surface roughness.

In addition, these probes are also good for imaging soft, fragile and near-liquid samples as the tip-sample attraction force is significantly reduced due to the unsurpassed subnanometer tip radius.
Conventional Silicon probe in Tapping mode. Tip radius Rtip~10 nm. Hi'RES probe in Tapping mode. Individual molecules are resolved. Tip radius Rtip~1 nm.
Routine height images of carbosilane dendrimers (9th generation) in a dense film obtained using Multimode Nanoscope IIIa AFM (Veeco Metrology Group). Scan size 150 nm. Diameter of dendrimer molecules is 9 nm. Images courtesy of S.S. Sheiko (University of North Caroline at Chapel Hill) and D.A. Ivanov (Free University of Brussels). Dendrimers courtesy of A. M. Muzafarov (ISPM RAS, Moscow.)

High-resolution porbes are recommended for scanning small areas below 250 nm at 512 sampling points. Lateral resolution below 1 nm is attainable.

 

Probes

Hi'RES-C probe has diamond-like spikes on the apex of the Sililcon tip. There can be additional smaller (satellite) spikes near the main one; however, the longest spike determines the resolution. Hi'RES-W probe has a single metal spike grown on the end of the Silicon tip.

Typical radius of extra tips
less than 1 nm

Typical height of extra tips
100..200 nm

Total tip height
20..25 μm

Material of the extra tips
amorphous, nonconducting,
wear-resistant

Typical radius of the spike
1 nm (range 0.5..3 nm)

Typical spike height
100..200 nm

Total tip height
20..25 μm

Material of the spike
Tungsten
high resolution

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

1 nm radius
multiple diamond-like tips
hi'res-C

1 nm radius Tungsten spike
hi'res-w
 
 

 

 

 

 
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