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Tapping mode is a form of the AM technique, in which large vibrations
of the probe are applied for imaging. It allows for measurements
to be made at ambient conditions. When the oscillating probe hits
the sample, its short-time interactions with minimal shear are less
destructive than the tip-sample forces in contact mode.
For identifying a type of tip-sample force, e.g. attractive or
repulsive, recording of the phase behavior of the AFM probe (for
example, as phase shift dependence on tip-sample separation) can
be used. Actually, at small amplitudes operation in tapping mode
is characterized by attractive tip-sample forces and overlaps with
operation in the earlier introduced noncontact mode. The latter
mode is characterized by small probe oscillations and net attractive
interactions which not necessary mean the true noncontact regime.
Stable oscillations of the tapping probe are possible when the
probe has enough energy to overcome adhesive and capillary forces
of the samples in air. Traditionally, Si probes with stiffness in
the 30-50 N/m, such as DP15/GP, are used for tapping mode experiments.
Depending on the type of the sample and problem to solve, probes
with stiffness ranging from 0.3 N/m to 400 N/m may be required.
Probes with low stiffness should be applied to soft materials or
particles with low adhesion to surface. Stiff probes are used for
imaging at the elevated forces needed for the visualization of mechanically-different
components of multicomponent samples.
The stiffness of the probe is only one of the parameters that influence
tip-sample forces in tapping mode. The other parameters are two
amplitudes: the amplitude of the free oscillating probe and the
set-point amplitude used for the feedback. The difference between
the set-point and free amplitude determines the tip-sample force
level, which controls the image contrast.
Between two cantilevers with a given spring constant, the one with
the higher resonant frequency is preferable because it allows for
a faster scanning rate. Cantilevers with a high resonant frequency
of 300 kHz and above provide the fastest possible scanning rates.
It should also be taken into account that polymer surfaces become
stiffer at higher frequencies. This property further reduces the
possibility of sample damage when using a high resonant frequency
cantilever.
High Q factor is desirable in tapping mode to optimize the sensitivity.
For a given resonant frequency and spring constant, a rectangular
cantilever generally has the higher Q factor in comparison to its
triangular analog.
Important: If your AFM study involves heating the probe,
Si cantilevers without any coating are preferred. Coated cantilevers
can bend and/or twist at elevated temperatures.
HI'RES tips provide extremely high resolution when used with light
tapping on smooth surfaces. See the application note on high
resolution imaging for details.
Tapping mode in liquids
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