General Purpose
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The resolution in AFM depends on the shape of surface features,
mechanical properties of the sample, and its interaction with the
tip. There are many of AFM applications where the size of the surface
features to resolve is in the 10..150-nm range; thus not requiring
tips with a radius smaller than 10 nm. Figures below demonstrate
clear resolution of large macromolecules along with submolecular
features such as branches.
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| Height images of dry single crystals
of polyethylene measured at 110°C temperature and after 1.5 hr
annealing at 115°C. Height histograms corresponding to AFM show
the evolution of lamellar thickness after annealing at different temperatures.
(*D.A. Ivanov, et all, Macromolecules, 35, 9813- 9818 (2002)). |
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High resolution may not be attainable when imaging real-time processes
such as molecular diffusion, crystallization, and wetting. This
depends on the characteristic process rates in relation to the scanning
rate and the distance between the scan sampling points. Moreover,
sharp probes needed for high resolution imaging require special
care in use, which leads to further reduction of the scanning speed.
10-nm resolution offered by General Purpose tips may be a compromise
in this case.
General Purpose probes are uncoated silicon tips that can be usually
used in Contact, Non-contact or Tapping mode for imaging topography
and mapping mechanical properties without significant limitations. Imaging of DNA is one of the examples of such applications (see Fig.2). |
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Fig. 2
Tapping mode topography image of DNA (Agilent 5500 AFM, diamond SCD
probe).
Scan size 750 nm. Scan height 1 nm.
Image courtesy of S. Magonov, Agilent Technologies. |
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General Purpose probes having tips with a radius of about 10-nm
provide good-quality images for a broad variety of samples. The
best resolution is achieved when scanning spherical particles that
are hard and exhibit weak attraction to the tip. Note that the resolution
of AFM images larger than 1µm by 1µm may be more determined
by the density of sampling points ratio than the General Purpose
tip radius.
General recommendations apply to the cantilever choice. Contact
mode needs probes with small spring constant below 1N/m, Non-contact
mode requires high-frequency probes, while cantilevers with intermediate
spring constant and
resonant frequency are optimal for most of samples in Tapping mode.
Diamond tips (SCD) have some benefits in these applications compared to silicon (NSC/CSC series). The properties of Diamond make the probes more durable, chemically stable and less contaminating. Diamond tips are also sharper than silicon (tip radius about 7 nm) and have smaller cone angle (about 20°).
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