Theory and Practice of SPM

This section comprises references to articles containing information on theoretical problems and fundamentals of Scanning Probe Microscopy issued mainly since 1996. Also, plenty of references to papers devoted to simulation and modeling experiments, as well as enhancements, improvements and developments of contemporary SPM methods and corresponding techniques are listed including those describing technical innovations and technological solutions.

We purposely do not engage in reviewing existent theories and models of SPM since such comprehensive and, on the other hand, highly specialized (in respect to every SPM method or technique) survey inevitably would inflate into a little book and should be performed by a group of persons whose experience in this field has been accumulated during the mature part of SPM history.

Most of the references to articles devoted to conceptual problems related to biology, AFM probes and AFM cantilevers are considered mainly in the appropriate sections of our Library and, as a rule, are not reflected here.

An attempt to classify different SPM methods and techniques probably has been undertaken by Friedbacher and Fuchs [1261], though some relatively well established techniques such as Conductive AFM (or Scanning Spreading Resistance Microscopy, SSRM) are not mentioned in this paper.

 

ID Reference list (newly come references are marked red)
985 A fast and versatile scan unit for scanning probe microscopy.
Knebel D., Amrein M., Voigt K., Reichelt R.
Scanning 19 (1997) 264-268.
10 A mechanical approach to the dissipation process in NC-AFM: experiments, model and simulation
G. Couturier, J.P. Aime, J. Salardenne, R. Boisgard, A. Gourdon, S. Gauthier
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S47-S50
801 A method to improve the quantitative analysis of SFM images at the nanoscale
B.A. Todd, S.J. Eppell
Surface Science, 491 (2001), 3, 473-483
802 A metrological scanning force microscope
X. Y., S.T. Smith, P.D. Atherton
Precision Engineering, 19 (1996), 1, 46-55
803 A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM) - A new approach to the measurement of adsorption isotherms at the solid-liquid interface
G. Jordan, C.M. Eggleston
Geochimica et Cosmochimica Acta, 62 (1998), 11, 1919-1923
270 A tower-shaped prototypic molecule designed as an atomically sharp tip for AFM applications
A.V. Rukavishnikov, M.D. Lee, A. Phadke, D.H. LaMunyo, P.A. Petukhov, J.F. Keana
Tetrahedron Letters, 40 (1999), 35, 6353-6356
794 Adhesion forces between individual ligand-receptor pairs
Florin E-L., Moy V.T. and Gaub E.H.
Science 264 (1994), 415-417
282 AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips
G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann
Thin Solid Films, 264 (1995), 2, 205-211
213 AFM imaging with an xy-micropositioner with integrated tip
P.-F. Indermuhle, V.P. Jaecklin, J. Brugger, C. Linder, N.F. De Rooij, M. Binggeli
Sensors and Actuators A: Physical, 47 (1995), 1-3, 562-565
194 AFM observations and simulations of jarosite growth at the molecular scale: probing the basis for the incorporation of foreign ions into jarosite as a storage mineral
U. Becker, B. Gasharova
Physics and Chemistry of Minerals, 28 (2001), 8, 545-556
1645 Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation
J. S. Villarrubia
J. Res. Natl. Inst. Stand. Technol. 102, (1997), 4, 425-454
307 Ambient atomic force microscopy images of stilbite and their interpretation by molecular simulations
M. Komiyama, A. Miyamoto, Y. Oumi, M. Kubo, K. Tsujimichi
Applied Surface Science, 121-122 (1997), 543-547
308 Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials
A. San Paulo, R. Garca
Surface Science, 471 (2001), 1-3, 71-79
320 AN02/DNP-hapten unbinding forces studied by molecular dynamics atomic force microscopy simulations
B. Heymann, H. Grubmuller
Chemical Physics Letters, 303 (1999), 1-2, 1-9
323 Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
B. Basnar, G. Friedbacher, H. Brunner, T. Vallant, U. Mayer, H. Hoffmann
Applied Surface Science, 171 (2001), 3-4, 213-225
1008 Application of neural networks to a scanning probe microscopy system
L. Hadjiiski, R. Linnemann, M. Stopka, E. Oesterschulze, I. Rangelow, R. Kassing
Thin Solid Films, 264 (1995), 2, 291-297
812 Atomic and chemical resolution in scanning force microscopy on ionic surfaces
A.L. Shluger, A.I. Livshits
Applied Surface Science, 141 (1999), 3-4, 274-286
1638 Atomic-force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure
P. Markiewicz and M. C. Goh
Langmuir 10 (1994), 5
435 Atomistic simulations of fluid structure and solvation forces in atomic force microscopy
D.L. Patrick, R.M. Lynden-Bell
Surface Science, 380 (1997), 2-3, 224-244
1011 Automated detection of particles, clusters and islands in scanning probe microscopy images
M.J.J. Jak, C. Konstapel, A. van Kreuningen, J. Verhoeven, R. van Gastel, J.W.M. Frenken
Surface Science, 494 (2001), 2, 43-52
814 Background correction in scanning probe microscope recordings of macromolecules
J.P.P. Starink, T.M. Jovin
Surface Science, 359 (1996), 1-3, 291-305
437 Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy
T. Arai, M. Tomitori
Applied Surface Science, 157 (2000), 4, 207-211
817 Bridge configuration of piezoresistive devices for scanning force microscopes
O. Ohlsson, J. Schelten, R. Jumpertz, F. Saurenbach
Sensors and Actuators A: Physical, 70 (1998), 1-2, 88-91
1104 Calculation of playback signals from MFM images using transfer functions
S.J.L. Vellekoop, J.J. Miles, J.C. Lodder, L. Abelmann, S. Porthun
Journal of Magnetism and Magnetic Materials, 193 (1999), 1-3, 474-478
438 Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
S. Hembacher, H. Bielefeldt, F.J. Giessibl, J. Mannhart
Applied Surface Science, 140 (1999), 3-4, 352-357
1012 Calibration of transfer standards for SPM
L. Koenders, G.-S. Peng, Gao-Feng
Microelectronic Engineering, 41-42 (1998), 615-618
820 Characterization of an integrated force sensor based on a MOS transistor for applications in scanning force microscopy
N.F. De Rooij, J. Brugger, A. Tonin, P. Vettiger, T. Akiyama, U. Staufer, H.-R. Hidber
Sensors and Actuators A: Physical, 64 (1998), 1, 1-6
1261 Classification of Scanning Probe Microscopies
Gernot Friedbacher and Harald Fuchs
Pure Appl. Chem., 71 (1999), 7, pp. 1337-1357
1108 Comparing the resolution of magnetic force microscopes using the CAMST reference samples
L. Abelmann, B. Stiefel, K. Babcock, P.J.A. van Schendel, R. Proksch, H.J. Hug, M.E. Best, A. Farley, C. Lodder, M. Haast, T. Pfaffelhuber, G.P. Heydon, A. Moser, S.R. Hoon, S. Porthun
Journal of Magnetism and Magnetic Materials, 190 (1998), 1-2, 135-147
1635 Computational model of the imaging process in scanning-x microscopy
H. Gallarda and R. Jain
Proceedings of Conference on Integrated Circuit Metrology, Inspection, and Process Control, V, SPIE Vol. 1464 (1991), 459.
22 Contact resonance imaging - a simple approach to improve the resolution of AFM for biological and polymeric materials
K. Wadu-Mesthrige, N.A. Amro, J.C. Garno, S. Cruchon-Dupeyrat, G.-Y. Liu
Applied Surface Science, 175-176 (2001), 391-398
7 Contrast inversion in nc-AFM on Si(111)7x7 due to short-range electrostatic interactions
M. Guggisberg, O. Pfeiffer, S. Schar, V. Barwich, M. Bammerlin, C. Loppacher, R. Bennewitz, A. Baratoff, E. Meyer
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S19-S22
38 Contrast mechanism in non-contact AFM on reactive surfaces
K. Terakura, R. Perez, I. Stich, M.C. Payne
Applied Surface Science, 123-124 (1998), 249-254
824 Contrast mechanism in non-contact SFM imaging of ionic surfaces
A.I. Livshits, A.L. Shluger, A.L. Rohl
Applied Surface Science, 140 (1999), 3-4, 327-332
463 Corrections to the van der Waals forces in application to atomic force microscopy
M. Bordag, G.L. Klimchitskaya, V.M. Mostepanenko
Surface Science, 328 (1995), 1-2, 129-134
465 Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy
G. Bar, R. Brandsch, M.-H.M.-H. Whangbo
Surface Science, 436 (1999), 1-3, L715-L723
973 Deformation, contact time, and phase-contrast in tapping mode scanning force microscopy
Tamayo J., Garcia R.
Langmuir 12 (1996), 4430-4435
830 Dependence of the measured monolayer height on applied forces in scanning force microscopy
X.D. Liu, M. Hartig, L.F. Chi, H. Fuchs
Thin Solid Films, 327-329 (1998), 262-267
1110 Description of magnetic force microscopy by three-dimensional tip Green's function for sample magnetic charges
H. Saito, S. Ishio, J. Chen
Journal of Magnetism and Magnetic Materials, 191 (1999), 1-2, 153-161
468 Description of phase imaging in tapping mode atomic force microscopy by harmonic approximation
M.-H. Whangbo, R. Brandsch, G. Bar
Surface Science, 411 (1998), 1-2, L794-L801
469 Design and application of scanning near-field optical/atomic force microscopy
T. Ataka, H. Muramatsu, K. Nakajima, N. Chiba, K. Homma, M. Fujihara
Thin Solid Films, 273 (1996), 1-2, 154-160
1604 Determining the form of atomic force microscope tips
P. Siedle, H-J. Butt. E.Bamberg, D.N. Wang, W. Kuhlbrand, J. Zach and M. Haider
Int. Phys. Conf. Ser. 130 (1993) 361
499 Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements
L. Delineau, G. Bar, R. Brandsch, M. Bruch, M.-H. Whangbo
Surface Science, 444 (2000), 1-3, L11-L16
75 Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing
M. Baba, S. Kakitani, H. Ishii, T. Okuno
Chemical Physics, 221 (1997), 1-2, 23-31
504 Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation
R.W. Stark, W.M. Heckl
Surface Science, 457 (2000), 1-2, 219-228
1023 Fractal analysis of scanning probe microscopy images
N. Almqvist
Surface Science, 355 (1996), 1-3, 221-228
507 Frequency modulation detection atomic force microscopy in the liquid environment
S.P. Jarvis, T. Ishida, T. Uchihashi, Y. Nakayama, H. Tokumoto
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S129-S132
508 Frequency shift and energy dissipation in non-contact atomic-force microscopy
S.H. Ke, T. Uda, K. Terakura
Applied Surface Science, 157 (2000), 4, 361-366
518 Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy
Y. Sugawara, S. Morita
Applied Surface Science, 140 (1999), 3-4, 406-410
519 Harmonic responses of a cantilever interacting with elastomers in tapping mode atomic force microscopy
M.-H. Whangbo, G. Bar, R. Brandsch, L. Delineau
Surface Science, 448 (2000), 1, L179-L187
250 How to describe AFM constant force surfaces in repulsive mode?
E.V. Blagov, G.L. Klimchitskaya, A.A. Lobashov, V.M. Mostepanenko
Surface Science, 349 (1996), 2, 196-206
524 How to measure energy dissipation in dynamic mode atomic force microscopy
H. Fuchs, V.B. Elings, B. Anczykowski, J.P. Cleveland, B. Gotsmann
Applied Surface Science, 140 (1999), 3-4, 376-382
45 Imaging of chemical reactivity and buckled dimers on Si(100)2x1 reconstructed surface with noncontact AFM
T. Tsukamoto, T. Okada, T. Minobe, Y. Sugawara, T. Uchihashi, S. Orisaka, S. Morita
Applied Surface Science, 140 (1999), 3-4, 304-308
8 Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2
A.S. Foster, A.L. Rohl, A.L. Shluger
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S31-S34
225 Impact of atomic relaxation on the breaks of constant force surfaces in AFM
E.V. Blagov, G.L. Klimchitskaya, V.M. Mostepanenko
Surface Science, 410 (1998), 2-3, 158-169
14 Instrumentation of STM and AFM combined with transmission electron microscope
D. Erts, A. Lohmus, R. Lohmus, H. Olin
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S71-S74
52 Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFM
M. Tomitori, T. Arai
Applied Surface Science, 144-145 (1999), 501-504
837 Intercomparison of SEM, AFM, and Electrical Linewidths
J. S. Villarrubia, R. Dixson, S. Jones, J. R. Lowney, M. T. Postek, R. A. Allen, and M. W. Cresswell
Metrology, Inspection, and Process Control for Microlithography XIII, Proc. SPIE 3677 (1999), pp. 587-598
1308 Lateral force microscopy - A quantitative approach
G.S. Watson, S. Myhra, C.T. Gibson
Wear, 213 (1997), 1-2, 72-79
786 Limits of force microscopy
Smith, D.P.E.
Rev. Sci. Instrum. 66 (1995), 3191-3195
1033 Melnikov-Based Dynamical Analysis of Microcantilevers in Scanning Probe Microscopy
M. Ashhab, M. V. Salapaka, M. Dahleh, I. Mezic
Nonlinear Dynamics, 20 (1999), 3, 197-220
1603 Mesoscopic Calibration of an Atomic Force Microscope
S.S. Sheiko, M. Moller, E.M.C.M. Reuvekamp and H.W. Zandbergen
Ultramicroscopy 53 (1994) 371-380
231 Model dependence of AFM simulations in non-contact mode
I.Y. Sokolov, G.S. Henderson, F.J. Wicks
Surface Science, 457 (2000), 1-2, 267-272
612 Molecular dynamics simulation of atomic force microscopy: imaging single-atom vacancies on Ag(001) and Pt(001)
M. Katagiri, R.M. Lynden-Bell, D.L. Patrick
Surface Science, 431 (1999), 1-3, 260-268
881 Molecular dynamics study of scanning force microscopy on self-assembled monolayers
T. Bonner, A. Baratoff
Surface Science, 377-379 (1997), 1082-1086
632 Nanoparticle sizing: a comparative study using atomic force microscopy, transmission electron microscopy, and ferromagnetic resonance
L.M. Lacava, B.M. Lacava, R.B. Azevedo, Z.G.M. Lacava, N. Buske, A.L. Tronconi, P.C. Morais
Journal of Magnetism and Magnetic Materials, 225 (2001), 1-2, 79-83
318 Normal and lateral force investigation using magnetically activated force sensors
S.P. Jarvis, H. Yamada, K. Kobayashi, A. Toda, H. Tokumoto
Applied Surface Science, 157 (2000), 4, 314-319
1450 Novel nanoindentation method for characterising multiphase materials
N.X. Randall, C. Julia-Schmutz, J.M. Soro, J. von Stebut, G. Zacharie
Thin Solid Films, 308-309 (1997), 1-4, 297-303
656 Observation of voltage contrast in non contact resonant mode Atomic Force Microscopy
P. Girard, G.C. Solal, S. Belaidi
Microelectronic Engineering, 31 (1996), 1-4, 215-225
659 On possibility of spin-polarized atomic force microscopy
H.J. Reittu
Surface Science, 334 (1995), 1-3, 257-262
664 Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy
R. Nishi, I. Houda, T. Aramata, Y. Sugawara, S. Morita
Applied Surface Science, 157 (2000), 4, 332-336
665 Phase imaging and stiffness in tapping-mode atomic force microscopy
M.-H. Whangbo, S.N. Magonov, V. Elings
Surface Science, 375 (1997), 2-3, l385-l391
32 Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces
I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer
Applied Surface Science, 115 (1997), 2, 190-198
1452 Progress in determination of the area function of indenters used for nanoindentation
K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seemann
Thin Solid Films, 377-378 (2000), 394-400
156 Proposal for new atomic force microscopy (AFM) imaging for a high aspect structure (digital probing mode AFM)
S. Hosaka, T. Morimoto, K. Kuroda, H. Kunitomo, T. Hiroki, T. Kitsukawa, S. Miwa, H. Yanagimoto, K. Murayama
Microelectronic Engineering, 57-58 (2001), 651-657
48 Pseudo-non-contact AFM imaging?
F.J. Wicks, G.S. Henderson, I.Y. Sokolov
Applied Surface Science, 140 (1999), 3-4, 362-365
62 Quantitative electrostatic force measurement in AFM
S. Jeffery, A. Oral, J.B. Pethica
Applied Surface Science, 157 (2000), 4, 280-284
221 Quantum oscillations in surface-tip transfer of adatoms on AFM/STM with a dissipative environment
I.S. Tilinin, M.A. Van Hove, M. Salmeron
Surface Science, 393 (1997), 1-3, l88-l92
897 Resonance modes of voltage-modulated scanning force microscopy
M. Labardi, V. Likodimos, M. Allegrini
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S79-S85
1636 Restoration of scanning probe microscope images
G. S. Pingali and R. Jain
Proceedings IEEE Workshop on Applications of Computer Vision, (1992) pp. 282-289.
251 Role of the adhesion between a nanotip and a soft material in tapping mode AFM
F. Dubourg, J.P. Aime
Surface Science, 466 (2000), 1-3, 137-143
898 Role of the force of friction on curved surfaces in scanning force microscopy
J.P. Aime, Z. Elkaakour, S. Gauthier, D. Michel, T. Bouhacina, J. Curely
Surface Science, 329 (1995), 1-2, 149-156
29 Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements
J.C. Arnault, A. Knoll, E. Smigiel, A. Cornet
Applied Surface Science, 171 (2001), 3-4, 189-196
984 Scan speed limit in atomic force microscopy
Butt H.J., Siedle P., Seifert K., Fendler K., Seeger T., Bamberg E., Weisenhorn A.L., Goldie K., Engel A.
J. Microsc. 169 (1993), 75-84
916 Scanning force microscopy simulations of well-characterized nanostructures on dielectric and semiconducting substrates
G. Cohen-Solal, F. Touhari, X. Bouju, M. Devel, C. Girard
Applied Surface Science, 125 (1998), 3-4, 351-359
1633 Scanning tunneling microscopy on rough surfaces-deconvolution of constant current images
G. Reiss, F. Schneider, J. Vancea, and H. Hoffmann
Appl. Phys. Lett. 57, (1990), 867
63 Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM
A. Nakasa, U. Akiba, M. Fujihira
Applied Surface Science, 157 (2000), 4, 326-331
921 Self-excited force-sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy
T. Itoh, T. Suga
Sensors and Actuators A: Physical, 54 (1996), 1-3, 477-481
30 Simulated nc-AFM images of Si(001) surface with nanotube tip
K. Tagami, N. Sasaki, M. Tsukada
Applied Surface Science, 172 (2001), 3-4, 301-306
245 Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging
M. Komiyama, K. Tsujimichi, K. Tazawa, A. Hirotani, H. Yamano, A. Miyamoto, E. Broclawik, M. Kubo
Surface Science, 357-358 (1996), 222-227
698 Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots
M. Komiyama, K. Tazawa, K. Tsujimichi, A. Hirotani, M. Kubo, A. Miyamoto
Thin Solid Films, 281-282 (1996), 1-2, 580-583
243 Simulation of interaction force between Si tip and Si(111)√3×√3-Ag surface of IET structure in noncontact AFM
N. Sasaki, S. Watanabe, H. Aizawa, M. Tsukada
Surface Science, 493 (2001), 1-3, 188-193
9 Simulation of NC-AFM images of xenon(111)
H. Holscher, W. Allers, U.D. Schwarz, A. Schwarz, R. Wiesendanger
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S35-S38
11 Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultra-high vacuum
T. Arai, M. Tomitori
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S51-S54
927 Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface
A.S. Foster, A.L. Shluger
Surface Science, 490 (2001), 1-2, 211-219
929 Strength measurement and calculations on silicon-based nanometric oscillators for scanning force microcopy operating in the gigahertz range
H. Kawakatsu, H. Toshiyoshi, D. Saya, K. Fukushima, H. Fujita
Applied Surface Science, 157 (2000), 4, 320-325
972 Studies of vibrating atomic force microscope cantilevers in liquid
Schaeffer T.E., Cleveland J.P., Ohnesorge F.M., Walters D.A., Hansma P.K.
J Appl Phys 80 (1996), 3622-3627.
933 Study of tip-sample interaction in scanning force microscopy
M. Luna, J. Colchero, J. Gomez-Herrero, A.M. Baro
Applied Surface Science, 157 (2000), 4, 285-289
1070 Surface analysis algorithms for scanning probe microscopy
C. Lindquist, F.K. Urban, C.S. Lindquist, F.K.I. Urban
Thin Solid Films, 270 (1995), 1-2, 399-405
938 Surface roughness of thin layers - A comparison of XRR and SFM measurements
Z. Stachura, M. Lekka, O. Filies, J. Lekki, O. Boling, K. Grewer, B. Cleff
Applied Surface Science, 141 (1999), 3-4, 357-365
233 The contrast mechanism for true atomic resolution by AFM in non-contact mode: Quasi-non-contact mode?
I.Y. Sokolov, G.S. Henderson, F.J. Wicks
Surface Science, 381 (1997), 1, l558-l562
244 The height dependence of image contrast when imaging by non-contact AFM
I.Y. Sokolov, G.S. Henderson
Surface Science, 464 (2000), 2-3, L745-L751
12 The measurement of hysteretic forces by dynamic AFM
B. Gotsmann, H. Fuchs
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S55-S58
766 The role of damping in phase imaging in tapping mode atomic force microscopy
L. Wang
Surface Science, 429 (1999), 1-3, 178-185
950 The role of shear forces in scanning force microscopy: a comparison between the jumping mode and tapping mode
F. Moreno-Herrero, P.J. de Pablo, J. Colchero, J. Gomez-Herrero, A.M. Baro
Surface Science, 453 (2000), 1-3, 152-158
769 Theoretical analysis of atomic-scale friction infrictional-force microscopy
N. Sasaki, M. Tsukada, S. Fujisawa, Y. Sugawara, S. Morita
Tribology Letters, 4 (1998), 2, 125-128
770 Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy
N. Sasaki, M. Tsukada
Applied Physics A: Materials Science & Processing, 72 (2001), 7, S39-S42
771 Theoretical simulation of atomic-scale friction in atomic force microscopy
N. Sasaki, K. Kobayashi, M. Tsukada
Surface Science, 357-358 (1996), 92-95
64 Theoretical simulation of noncontact AFM images of Si(111)√3×√3-Ag surface based on Fourier expansion method
N. Sasaki, H. Aizawa, M. Tsukada
Applied Surface Science, 157 (2000), 4, 367-372
47 Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM
N. Sasaki, M. Tsukada
Applied Surface Science, 140 (1999), 3-4, 339-343
775 Time-frequency modeling of atomic force microscopy
D. Dragoman, M. Dragoman
Optics Communications, 140 (1997), 4-6, 220-225
1362 STM studies: spatial resolution limits to fit observations in nanotechnology
P. D. Szkutnik, A. Piednoir, A. Ronda, F. Marchi, D. Tonneau, H. Dallaporta, M. Hanbucken
Applied Surface Science 164 (2000) 169-174
1324 Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy
Y. H. Liau, N. F. Scherer
Appl. Phys. Lett. 74 (1999), 26, pp. 3966-3968
1326 High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
F.J.Giessibl
Appl. Phys. Lett. 74 (1999), 26, p. 4070
1327 The influence of Coulomb interaction of localized charges on low-temperature scanning tunnelling spectra of surface nanodefects
Maslova N.S. Oreshkin A.I., Oreshkin S.I., Panov V.I., Savinov S.V., Kalachev A.A.
J. Phys.: Cond. Matter 13 (2001) 18, 3941-3948
1331 Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves
B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs
Applied Surface Science 140 (1999) 314-319
1332 Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip-microlever system near a surface
R. Boisgard, D. Michel, J.P. Aimé
Surface Science 401 (1998) 199-205
1333 Scanning tunneling microscope-induced molecular motion and its effect on the image formation
Matthias Böhringer, Wolf-Dieter Schneider, Richard Berndt
Surface Science 408 (1998) 72-85
1334 The use of macros in AFM image analysis and image processing
Barrett S. D., Bickmore B. R., Rufe E., Hochella M. F., Torzo G. and Cerolini. D
J. Comp. Ass. Microsc. 10 (1998), 77
1338 Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing
T. Fujii, K. Imabori, H. Kawakatsu, Sh. Watanabe and H. Bleuler
Nanotechnology 10 (1999) 380-384
1345 Imitation of non-contact mode while scanning in the presence of an electric double layer?
I. Yu. Sokolov, G.S. Henderson, F. J. Wicks
Applied Surface Science 140 (1999) 422-427
1346 Theoretical and experimental evidence for "true" atomic resolution under non-vacuum conditions
I. Yu. Sokolov, G.S. Henderson, F. J. Wicks
J. Appl. Phys. 86 (1999) 10, 5537-5540
1358 Sensitivity of vibration modes of atomic force microscope cantilevers in continuous surface contact
Win-Jin Chang
Nanotechnology 13 (2002) 510-514
1362 STM studies: spatial resolution limits to fit observations in nanotechnology
P. D. Szkutnik, A. Piednoir, A. Ronda, F. Marchi, D. Tonneau, H. Dallaporta, M. Hanbucken
Applied Surface Science 164 (2000) 169-174
1366 Measuring discrete feature dimensions in atomic force microscopy images with Image SXM
Bickmore B. R., Rufe E., Barrett S. D. and Hochella M. F.
Geol. Mater. Res. 1 (1999), 5 (http://gmr.minsocam.org/ papers/v1/v1n5/v1n5abs.html)
1368 Opening and viewing image data files
Entwistle A.
Proc. Roy. Microsc. Soc. 36 (2001), 101
1375 A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology
Aiguo Wu, Zhuang Li, Lihua Yu, Hongda Wang and Erkang Wang
Ultramicroscopy, Vol. 92 (3-4) (2002) pp. 201-207
1377 Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers
X.D. Cui, X. Zarate, J. Tomfohr, A. Primak, A.L. Moore, T.A. Moore, D. Gust, G. Harris, O.F. Sankey and S.M. Lindsay
Ultramicroscopy, Vol. 92 (2) (2002) pp. 67-76
1378 A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this process
Mizuki Ono, Dirk Lange, Oliver Brand, Christoph Hagleitner and Henry Baltes
Ultramicroscopy, Vol. 91 (1-4) (2002) pp. 9-20
1382 Self-sensing piezoresistive cantilever and its magnetic force microscopy applications
Hiroshi Takahashi, Kazunori Ando and Yoshiharu Shirakawabe
Ultramicroscopy, Vol. 91 (1-4) (2002) pp. 63-72
1382 Developments for inverted atomic force microscopy
James C. Mabry, Tim Yau, Hui-Wen Yap and John-Bruce D. Green
Ultramicroscopy, Vol. 91 (1-4) (2002) pp. 73-82
1384 Mapping and control of atomic force on Si(111)√3×√3-Ag surface using noncontact atomic force microscope
S. Morita and Y. Sugawara
Ultramicroscopy, Vol. 91 (1-4) (2002) pp. 89-96
1410 Materials' properties measurements: Choosing the optimal scanning probe microscope configuration
N. A. Burnham, G. Gremaud, A. J. Kulik, P.-J. Gallo, and F. Oulevey
J. Vac. Sci. Technol. B14 (1996), 2, 1308-1312
1411 Local mechanical spectroscopy with nanometer-scale lateral resolution
F. Oulevey, G. Gremaud, A. Sémoroz, A. J. Kulik, N. A. Burnham, E. Dupas, and D. Gourdon
Rev. Sci. Instrum., 69 (1998), 5, 2085-2094
1413 Surface Forces and Adhesion
N. A. Burnham and A.J. Kulik
in "Handbook of Micro/Nanotribology", B. Bhushan, ed., 1997, CRC Press, Boca Raton, FL.
1414 Scanning local-acceleration microscopy
N. A. Burnham, A. J. Kulik, G. Gremaud, P.-J. Gallo, and F. Oulevey
J. Vac. Sci. Technol. B14 (1996), 2, 794-799
1416 How does a tip tap?
N. A. Burnham, O. P. Behrend, F. Oulevey, G. Gremaud, P.-J. Gallo, D. Gourdon, E. Dupas, A. J. Kulik, H. M. Pollock and G. A. D. Briggs
Nanotechnology 8 (1997) 67-75
1417 Fabrication of Nanoscale Structures using STM and AFM
A. A. Baski
in "Advanced Semiconductor and Organic Nano-techniques, Part 3" ed. Morkos, Academic Press (2002)
1418 Mapping and control of atomic force with noncontact atomic force microscopy
Seizo Morita and Yasuhiro Sugawara
RIKEN Review, 36 (2001), 3-5
1419 New Method for Noncontact AFM Image Simulations
N. Sasaki and M. Tsukada
Jpn. J. Appl. Phys., 38 (1999) 192
1420 Theory of non-contact dissipation force microscopy
M. Gauthier and M. Tsukada
Physical Review B 60 (1999) 11716
1421 Software For Scanning Microscopy
S. D. Barrett
Proc. Roy. Microsc. Soc. 37 (2002) 167
1422 Fourier Expansion Method for Noncontact AFM Image Simulations-Application to Si(111) √3×√3Ag Surface
N. Sasaki, H. Aizawa and M. Tsukada
Jpn. J. Appl. Phys., 39 (2000) L174
1423 Effect of Microscopic Nonconservative Process on Noncontact Atomic Force Microscopy
N. Sasaki and M. Tsukda
Jpn. J. Appl. Phys., 39 (2000) L1334
1424 Damping Mechanism in Dynamic Force Microscopy
M. Gauthier and M. Tsukada
Phys. Rev. Lett. 85 (2000) 5348
1425 Simulated Noncontact Atomic Force Microscopy Images of Si(001) Surface with Silicon Tip
K. Tagami and M. Tsukada
Jpn. J. Appl. Phys., 39 (2000) 6025
1426 Models of image contrast in scanning force microscopy on insulators
A. L. Shluger, A. I. Livshits, A. S. Foster and C. R. A.Catlow
J. Phys.: Condens. Matter 11 (1999) R295-R322
1428 Experimental validation of theoretical models for the frequency response of atomic force microscope cantilever beams immersed in fluids
J. W. M. Chon, P. Mulvaney and J. E. Sader
J. Appl. Phys. 87 (2000), 8, pp. 3978-3988
1429 Oscillatory Forces in Liquid Atomic Force Microscopy
Sean J. O'Shea
Jpn. J. Appl. Phys., 40 (2001) 4309-4313
1430 Dynamic Scanning Force Microscopy at Low Temperatures
W. Allers, A. Schwarz, H. Holscher, U. D. Schwarz and R. Wiesendanger
Jpn. J. Appl. Phys., 39 (2000) 3701-3706
1431 Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope
Kimitake Fukushima, Daisuke Saya and Hideki Kawakatsu
Jpn. J. Appl. Phys., 39 (2000) 3747-3749
1432 Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
K. Suzuki, M. Iwatsuki, S. Kitamura and Ch. B. Mooney
Jpn. J. Appl. Phys., 39 (2000) 3750-3752
1433 Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum
T. Arai and M. Tomitori
Jpn. J. Appl. Phys., 39 (2000) 3753-3757
1434 Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite
Yasuo Hoshi, Takayoshi Kawagishi and Hideki Kawakatsu
Jpn. J. Appl. Phys., 39 (2000) 3804-3807
1435 How Much Chemistry is There in Chemical Force Microscopy?
R. McKendry, M.-E. Theoclitou, C. Abell and T. Rayment
Jpn. J. Appl. Phys., 38 (1999) 3901-3907
1436 Bases of Chemical Force Microscopy by Friction: Energetics and Dynamics of Wearless Friction between Organic Monolayers in Terms of Chemical and Physical Properties of Molecules
M. Fujihira and T. Ohzono
Jpn. J. Appl. Phys., 38 (1999) 3918-3931
1437 Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection
M. Kageshima, H. Ogiso, S. Nakano, M. A. Lantzand and H. Tokumoto
Jpn. J. Appl. Phys., 38 (1999) 3958-3961
1438 Protein Stretching IV: Analysis of Force-Extension Curves
A. Ikai and T. Wang
Jpn. J. Appl. Phys., 39 (2000) 3784-3788
1439 Low-temperature scanning probe microscopy of surface and subsurface charges
Vogel M., Stein B., Pettersson H. and Karrai K.
Appl. Phys. Lett. 78 (2001), 17, pp. 2592-2594
1440 Plug "n" play scanning probe microscopy
Michely T., Kaiser M. and Rost M.J.
Rev. Sci. Instrum., 71 (2000), 12, pp. 4461-4467
1444 Electrostatic energy calculation for the interpretation of scanning probe microscopy experiments
L.N. Kantorovich, A.I. Livshits, M. Stoneham
J. Phys.: Condens. Matter 12 (2000), 6, pp. 795-814
1449 Investigation of nanolocal fluorescence resonance energy transfer for scanning probe microscopy
G.T. Shubeita, S.K. Sekatskii, M. Chergui, G. Dietler, V.S. Letokhov
Appl. Phys. Lett. 74 (1999), 23, pp. 3453-3455
1200 Chemical force microscopy. Method maps functional groups of surfaces
R. Baum
Chemical & Engineering News, 73 (1994) 6
1204 The influence of a viscous fluid on the vibration dynamics of scanning near-field optical microscopy fiber probes and atomic force microscopy cantilevers
S. Kirstein, M. Mertesdorf, M. Schonhoff
J. Appl. Phys. 84 (1998) pp. 1782-1790
1207 Low temperature magnetic force microscopy with enhanced sensitivity based on piezoresistive detection
A. Volodin, K. Temst, C. Van Haesendonck, and Y. Bruynseraede
Rev. Sci. Instrum., 71 (2000), 12, pp. 4468-4473
1208 A Model for Friction in Atomic Force Microscopy
S. Salapaka and M. Dahleh
Proc. of American Control Conf., Chicago, Illinois, June (2000) pp. 2102-2107
1216 Atomic Force Microscopy at Solid-Liquid Interfaces
S. J. O'Shea and M. E. Welland
Langmuir 14 (1998) 4186-4197
1217 Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy
S. P. Jarvis, H. Tokumoto, H. Yamada, K. Kobayashi, A. Toda
Appl. Phys. Lett. 75 (1999) 24, pp. 3883-3885
1230 Scanning Kelvin Probe Force Microscopy - Chances and Limitations for In-Situ Delamination Studies
E. Hornung, M. Stratmann, M. Rohwerder
The 200th Meeting of The Electrochemical Society, Inc. and the 52nd Meeting of The International Society of Electrochemistry, San Francisco, California, September 2-7, (2001), 568
1231 Resolution and contrast in Kelvin probe force microscopy
H. O. Jacobs, P. Leuchtmann, O. J. Homan and A. Stemmer
J. Appl. Phys. 84 (1998), 3, 1168-1173
1237 Simulation of SCM measurements on micro-sectioned and bevelled n+-p samples
L. Ciampolini, F. Giannazzo, M. Ciappa, W. Fichtner, and V. Raineri
Materials Science in Semiconductor Processing, 4 (2001), 1-3, 85-88
1238 SCaMsim, a new 3D simulation tool for SCM
L. Ciampolini, M. Ciappa, P. Malberti, and W. Fichtner
2000 international conference on characterization and metrology for ULSI technology, Gaithersburg, June 26-29, (2000)
1240 Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips
M. L. O'Malley, G. L. Timp, W. Timp, S. V. Moccio, and J. P. Garno
Appl. Phys. Lett. 74 (1999) pp. 3672-3674
1252 Theories of Scanning Probe Microscopes: Origins, Applications and Limitations
W. A. Hofer, A. S. Fostery and A. L. Shluger
http://www.cmmp.ucl.ac.uk/~wah/stm/Lecture/spm_rev_2706.pdf
1255 Measuring the tip-sample separation in dynamic force microscopy
A. Bugacov, R. Resch, C. Baur, N. Montoya, K. Woronowicz, A. Papson, B. E. Koel, A. A. G. Requicha and P. Will
Probe Microscopy, 1 (1999), pp. 345-354
1259 Manipulation of nanoparticles using dynamic force microscopy: simulation and experiments
R. Resch, C. Baur, A. Bugacov, B. E. Koel, A. Madhukar, A. A. G. Requicha and P. Will
Applied Physics A: Materials Science & Processing, 67 (1998), 3, pp. 265-271
1263 Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samples
Robert Stephenson, Anne Verhulst, Peter De Wolf, Matty Caymax, and Wilfried Vandervorst
J. Vac. Sci. Technol., B18 (2000), 1, pp. 405-408
1282 Theoretical modelling of scanning tunnelling microscopy, scanning tunnelling spectroscopy and atomic force microscopy
D Drakova
Rep. Prog. Phys. 64 (2001) 205-290
1285 Nanomechanics from atomic resolution to molecular recognition based on atomic force microscopy technology
H. P. Lang, M. Hegner, E. Meyer and Ch. Gerber
Nanotechnology 13 (2002) 5, R29-R36
1290 Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
C. Sommerhalter, T. Glatzel, T.W. Matthes, A. Jager-Waldau, M.C. Lux-Steiner
Applied Surface Science, 157 (2000), 4, 263-268
1297 Hysteresis in Force Probe Measurements: a Dynamical Systems Perspective
Bruce E. Shapiro and Hong Qian
J. Theor. Biol. 194 (1998) pp. 551-559
1298 Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings
Sriram Sundararajan, Bharat Bhushan
J. Mater. Res. 16 (2001) 2, 437-445
1677 Quantitative Work Function Measurements on a Nanometer Scale: Kelvin Probe Force Microscopy in Ultrahigh Vacuum
S. Sadewasser
In "Science, Technology and Education of Microscopy: an Overview", Vol. 1, ed. A. Mendez-Vilas (Formatex, Badajoz, Spain, 2002), in print (2002)
1679 Work Function Imaging using Kelvin Probe Force Microscopy
S. Sadewasser, and Th. Glatzel
Bulletin of the Microscopy Society of Canada, 30 (2002) 19
1689 Dynamic Force Microscopy in Fluid
M. Lantz, Y.Z. Liu, X.D. Cui, H. Tokumoto and S.M. Lindsay
Surface and Interface Analysis, 27 (1999) 354-360
1692 STM Contrast, Electron Transfer Chemistry and Conduction in Molecules
W. Han, E.N. Durantini, T.A. Moore, A.L. Moore, D. Gust, P. Rez, G. Leatherman, G.R. Sealey, N.J. Tao and S.M. Lindsay
Journal of Physical Chemistry, 101 (1997) 10719-10725
1693 Relationship between stiffness and force in single molecule pulling experiments
Y.Z. Liu, S.H. Leuba and S.M. Lindsay
Langmuir 15 (1999) pp. 8547-8548
1840 A constant compliance force modulation technique for scanning force microscopy (SFM) imaging of polymer surface elasticity
E. W. Stroup, A. Pungor, V. Hlady
Ultramicroscopy, 66 (1996) 3-4, 237-249
1997 Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
B. Anczykowski, D. Kruger, H. Fuchs
Phys. Rev. B: Condensed Matter., 53 (1996) 23, 15485-15488
2120 Electrostatic tip-sample interaction in immersion force microscopy of semiconductors
C. Donolato
Phys. Rev. B: Condensed Matter., 54 (1996) 3, 1478-1481
2147 Fractal surface dimension from cyclic I-V studies and atomic-force microscopy: Role of noncontiguous reaction sites
M. Stromme Mattsson, G. A. Niklasson, C. G. Granqvist
Phys. Rev. B: Condensed Matter., 54 (1996) 24, 17884-17887
2148 Freeze-substitution as a preparative technique for immunoelectronmicroscopy: evaluation by atomic force microscopy
J. E. Moreira, T. S. Reese, B. Kachar
Microsc. Res. Tech., 33 (1996) 3, 251-261
2178 Imaging material properties by resonant tapping-force microscopy: A model investigation
R. G. Winkler, J. P. Spatz, S. Sheiko, M. Moller, P. Reineker, O. Marti
Phys. Rev. B: Condensed Matter., 54 (1996) 12, 8908-8912
2360 Quantitative analysis of a fracture surface by atomic force microscopy
P. Daguier, S. Henaux, E. Bouchaud, F. Creuzet
Phys. Rev. E: Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics, 53 (1996) 6, 5637-5642
2372 Role of the tip atom in STM and AFM: Theory of atom transfer
E. Koetter, D. Drakova, G. Doyen
Phys. Rev. B: Condensed Matter., 53 (1996) 24, 16595-16608
2483 The effect of deformation on the lateral resolution of atomic force microscopy
J. Yang, J. Mou, J. Y. Yuan, Z. Shao
J. Microsc., 182 (1996) 2, 106-113
2504 Theory of Scanning Tunneling Microscopy Probe of Impurity States in a D-Wave Superconductor
M. I. Salkola, A. V. Balatsky, D. J. Scalapino
Phys. Rev. Lett., 77 (1996) 9, 1841-1844
1843 Vortices in stratified superconductors: Application to magnetic force microscopy
M. W. Coffey, E. T. Phipps
Phys. Rev. B: Condensed Matter., 53 (1996) 1, 389-401
1839 A closer look at a molecular motor by atomic force microscopy
A. Engel
Biophys. J., 72 (1997) 3, 988
2063 Data analysis using the Internet: the World Wide Web scanning probe microscopy data analysis system
P. M. Williams, M. C. Davies, C. J. Roberts, S. J. Tendler
Analyst, 122 (1997) 10, 1001-1006
2114 Electrochemical Applications of in Situ Scanning Probe Microscopy
A. A. Gewirth, B. K. Niece
Chem. Rev., 97 (1997) 4, 1129-1162
2145 Force-distance curves by AFM. A powerful technique for studying surface interactions
B. Cappella, P. Baschieri, C. Frediani, P. Miccoli, C. Ascoli
IEEE Eng Med Biol Mag, 16 (1997) 2, 58-65
2224 Introduction: Force and Tunneling Microscopy
S. Chiang
Chem. Rev., 97 (1997) 4, 1015-1016
2395 Scanning force microscopy under aqueous solutions
C. Bustamante, C. Rivetti, D. J. Keller
Current Opinion in Structural Biology, 7 (1997) 5, 709-716
2396 Scanning probe microscopy
R. J. Colton, D. R. Baselt, Y. F. Dufrene, J. B. Green, G. U. Lee
Current Opinion in Chemical Biology, 1 (1997) 3, 370-377
2400 Scanning probe microscopy. Probing the future
M. Miles
Science, 277 (1997) 5333, 1845-1847
2402 Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy
R. W. Carpick, M. Salmeron
Chem. Rev., 97 (1997) 4, 1163-1194
2451 Subpiconewton intermolecular force microscopy
M. Tokunaga, T. Aoki, M. Hiroshima, K. Kitamura, T. Yanagida
Biochemical and Biophysical Research Communications, 231 (1997) 3, 566-569
1908 Atomic force microscopy and modeling of natural elastic fibrillin polymers
E. Hanssen, S. Franc, R. Garrone
Biol. Cell., 90 (1998) 3, 223-228
2125 Evaluation of Surface Ionization Parameters from AFM Data
B. V. Zhmud, A. Meurk, L. Bergstrom
J. Colloid. Interface. Sci., 207 (1998) 2, 332-343
1850 A physical approach to reduce nonspecific adhesion in molecular recognition atomic force microscopy
O. H. Willemsen, M. M. Snel, L. Kuipers, C. G. Figdor, J. Greve, B. G. De Grooth
Biophys. J., 76 (1999) 2, 716-724
1974 Atomic force microscopy: a forceful way with single molecules
A. Engel, H. E. Gaub, D. J. Muller
Curr. Biol., 9 (1999) 4, R133-R136
2020 Chemical and biochemical analysis using scanning force microscopy
H. Takano, J. R. Kenseth, S. S. Wong, J. C. O'Brien, M. D. Porter
Chem. Rev., 99 (1999) 10, 2845-2890
2044 Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate
B. R. Neves, M. E. Salmon, P. E. Russell, E. B. Troughton, Jr.
Microscopy and Microanalysis, 5 (1999) 6, 413-419
2153 Graphical method for force analysis: macromolecular mechanics with atomic force microscopy
H. Qian, B. E. Shapiro
Proteins, 37 (1999) 4, 576-581
2164 High speed atomic force microscopy of biomolecules by image tracking
S. J. van Noort, K. O. van Der Werf, B. G. de Grooth, J. Greve
Biophys. J., 77 (1999) 4, 2295-2303
2332 Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion
O. H. Willemsen, M. M. Snel, S. J. van Noort, K. O. van der Werf, B. G. de Grooth, C. G. Figdor, J. Greve
Ultramicroscopy, 80 (1999) 2, 133-144
1862 Adhesion artefacts in atomic force microscopy imaging
J. I. Paredes, A. Martinez-Alonso, J. M. Tascon
J. Microsc., 200 (2000) 2, 109-113
1864 Adhesion forces measured by atomic force microscopy in humid air
D. L. Sedin, K. L. Rowlen
Anal. Chem., 72 (2000) 10, 2183-2189
1881 Alignment of AFM images using an iterative mathematical procedure
J. Romer, M. Plaschke, J. I. Kim
Ultramicroscopy, 85 (2000) 2, 99-105
1882 Amplitude curves and operating regimes in dynamic atomic force microscopy
R. Garcia, A. San Paulo
Ultramicroscopy, 82 (2000) 1-4, 79-83
1900 Aspects of the physical chemistry of polymers, biomaterials and mineralised tissues investigated with atomic force microscopy (AFM)
K. D. Jandt, M. Finke, P. Cacciafesta
Colloids. Surf. B. Biointerfaces, 19 (2000) 4, 301-314
2034 Combined scanning electrochemical-atomic force microscopy
J. V. Macpherson, P. R. Unwin
Anal. Chem., 72 (2000) 2, 276-285
2053 Controllable reversibility of an sp(2) to sp(3) transition of a single wall nanotube under the manipulation of an AFM tip: A nanoscale electromechanical switch?
L. Liu, C. S. Jayanthi, M. Tang, S. Y. Wu, T. W. Tombler, C. Zhou, L. Alexseyev, J. Kong, H. Dai
Phys. Rev. Lett., 84 (2000) 21, 4950-4953
2143 Force Calibration in Lateral Force Microscopy
R. G. Cain, S. Biggs, N. W. Page
J. Colloid. Interface. Sci., 227 (2000) 1, 55-65
1828 Influence of force acting on side face of carbon nanotube in atomic force microscopy
S. Akita, H. Nishijima, T. Kishida and Y. Nakayama
Jpn. J. Appl. Phys., 39 (2000) 3724-3727
2309 New Approach to the Study of Particle-Surface Adhesion Using Atomic Force Microscopy
G. A. Willing, T. H. Ibrahim, F. M. Etzler, R. D. Neuman
J. Colloid. Interface. Sci., 226 (2000) 1, 185-188
2331 Optimal sensitivity for molecular recognition MAC-mode AFM
H. Schindler, D. Badt, P. Hinterdorfer, F. Kienberger, A. Raab, S. Wielert-Badt, VPh Pastushenko
Ultramicroscopy, 82 (2000) 1-4, 227-235
2397 Scanning probe microscopy
P. T. Lillehei, L. A. Bottomley
Anal. Chem., 72 (2000) 12, 189R-196R
2409 Shear modulation force microscopy study of near surface glass transition temperatures
S. Ge, Y. Pu, W. Zhang, M. Rafailovich, J. Sokolov, C. Buenviaje, R. Buckmaster, R. M. Overney
Phys. Rev. Lett., 85 (2000) 11, 2340-2343
2437 Structure and spectroscopy of surface defects from scanning force microscopy: theoretical predictions
L. N. Kantorovich, A. L. Shluger, A. M. Stoneham
Phys. Rev. Lett., 85 (2000) 18, 3846-3849
2516 Topographic and phase-contrast imaging in atomic force microscopy
G. K. Pang, K. Z. Baba-Kishi, A. Patel
Ultramicroscopy, 81 (2000) 2, 35-40
1854 A sample scanning system with nanometric accuracy for quantitative SPM measurements
G. B. Picotto, M. Pisani
Ultramicroscopy, 86 (2001) 1-2, 247-254
1911 Atomic force microscopy applications in macromolecular crystallography
A. McPherson, A. J. Malkin, Y. G. Kuznetsov, M. Plomp
Acta Crystallogr. D: Biol. Crystallogr., 57 (2001) 8, 1053-1060
1821 ATOMIC FORCE MICROSCOPY: You may squeeze the atoms but don't mangle the surface!
Alex de Lozanne
Science, 291 (2001) 2561-2562
1996 Can atomic force microscopy achieve atomic resolution in contact mode?
M. R. Jarvis, R. Perez, M. C. Payne
Phys. Rev. Lett., 86 (2001) 7, 1287-1290
2036 Combining AFM and FRET for high resolution fluorescence microscopy
S. A. Vickery, R. C. Dunn
J. Microsc., 202 (2001) 2, 408-412
2066 Detachment of Particles from Surfaces: An AFM Study
A. M. Freitas, M. M. Sharma
J. Colloid. Interface. Sci., 233 (2001) 1, 73-82
2106 Effect of Gravity on Colloidal Deposition Studied by Atomic Force Microscopy
E. Dokou, M. A. Barteau, N. J. Wagner, A. M. Lenhoff
J. Colloid. Interface. Sci., 240 (2001) 1, 9-16
2122 Energy dissipation in atomic force microscopy and atomic loss processes
P. M. Hoffmann, S. Jeffery, J. B. Pethica, H. O. Ozer, A. Oral
Phys. Rev. Lett., 87 (2001) 26, 265502
2131 Examination of line crossings by atomic force microscopy
S. Kasas, A. Khanmy-Vital, G. Dietler
Forensic. Sci. Int., 119 (2001) 3, 290-298
2144 Force measurements on single molecular contacts through evanescent wave microscopy
G. Zocchi
Biophys. J., 81 (2001) 5, 2946-2953
2200 Implementation of self-sensing SPM cantilevers for nano-force measurement in microrobotics
S. Fahlbusch, S. Fatikow
Ultramicroscopy, 86 (2001) 1-2, 181-190
2217 Integrating an ultramicroelectrode in an AFM cantilever: combined technology for enhanced information
C. Kranz, G. Friedbacher, B. Mizaikoff, A. Lugstein, J. Smoliner, E. Bertagnolli
Anal. Chem., 73 (2001) 11, 2491-2500
2219 Interfacial water dielectric-permittivity-profile measurements using atomic force microscopy
O. Teschke, G. Ceotto, E. F. de Souza
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 64 (2001) 1-1, 11605
2221 Intermittent contact AFM using the higher modes of weak cantilever
A. Ulcinas, V. Snitka
Ultramicroscopy, 86 (2001) 1-2, 217-222
2230 Investigation of crossed SAW fields by scanning acoustic force microscopy
G. Behme, T. Hesjedal
IEEE Trans. Ultrason. Ferroelectr. Freq. Control., 48 (2001) 4, 1132-1138
1834 Nanotweezers Consisting of Carbon Nanotubes Operating in an Atomic Force Microscope
S. Akita, Y. Nakayama, S. Mizooka, Y. Takano, T. Okawa, Y. Miyatake, S. Yamanaka, M. Tsuji and T. Nosaka
Appl. Phys. Lett., 79 (2001) 1691-1693
2310 Noncontact electrochemical imaging with combined scanning electrochemical atomic force microscopy
J. V. Macpherson, P. R. Unwin
Anal. Chem., 73 (2001) 3, 550-557
2361 Quantitative Analysis of Fluid Interface-Atomic Force Microscopy
D. E. Aston, J. C. Berg
J. Colloid. Interface. Sci., 235 (2001) 1, 162-169
2377 Scaling-index method as an image processing tool in scanning-probe microscopy
F. Jamitzky, R. W. Stark, W. Bunk, S. Thalhammer, C. Rath, T. Aschenbrenner, G. E. Morfill, W. M. Heckl
Ultramicroscopy, 86 (2001) 1-2, 241-246
2406 Semi-automatized processing of AFM force-spectroscopy data
C. Gergely, B. Senger, J. C. Voegel, J. K. Horber, P. Schaaf, J. Hemmerle
Ultramicroscopy, 87 (2001) 1-2, 67-78
2411 Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopy
P. Gall-Borrut, B. Belier, P. Falgayrettes, M. Castagne, C. Bergaud, P. Temple-Boyer
J. Microsc., 202 (2001) 1, 34-38
2431 Static Method to Evaluate Interaction Forces by AFM
N. Ishida, M. Sakamoto, M. Miyahara, K. Higashitani
J. Colloid. Interface. Sci., 235 (2001) 1, 190-193
2497 The saga of AFM
C. M. Harris
Anal. Chem., 73 (2001) 21, 627A-635A
2505 Thermal enhancement of AFM phase contrast for imaging diblock copolymer thin film morphology
M. J. Fasolk, A. M. Mayes, N. Magonov
Ultramicroscopy, 90 (2001) 1, 21-31
2506 Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy
R. W. Stark, T. Drobek, W. M. Heckl
Ultramicroscopy, 86 (2001) 1-2, 207-215
2531 Unambiguous interpretation of atomically resolved force microscopy images of an insulator
A. S. Foster, C. Barth, A. L. Shluger, M. Reichling
Phys. Rev. Lett., 86 (2001) 11, 2373-2376
1849 A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images
A. C. Lin, M. C. Goh
J. Microsc., 205 (2002) 2, 205-208
1891 Analysis of matrix dynamics by atomic force microscopy
H. G. Hansma, D. O. Clegg, E. Kokkoli, E. Oroudjev, M. Tirrell
Methods Cell Biol., 69 (2002) 163-193
1956 Atomic force microscopy probes go electrochemical
C. E. Gardner, J. V. Macpherson
Anal. Chem., 74 (2002) 21, 576A-584A
2037 Comment on "Damping mechanism in dynamic force microscopy"
H. Holscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, R. Wiesendanger
Phys. Rev. Lett., 88 (2002) 1, 19601
2050 Contact mechanics modeling of pull-off measurements: effect of solvent, probe radius, and chemical binding probability on the detection of single-bond rupture forces by atomic force microscopy
H. Skulason, C. D. Frisbie
Anal. Chem., 74 (2002) 13, 3096-3104
2079 Developments in dynamic force microscopy and spectroscopy
A. D. Humphris, M. J. Miles
Methods Cell Biol., 68 (2002) 337-355
2102 Dynamic simulations of adhesion and friction in chemical force microscopy
Y. Leng, S. Jiang
J. Am. Chem. Soc., 124 (2002) 39, 11764-11770
2126 Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation
U. Rabe, M. Kopycinska, S. Hirsekorn, W. Arnold
Ultrasonics, 40 (2002) 1-8, 49-54
2213 Influence of metal ion sorption on colloidal surface forces measured by atomic force microscopy
C. J. Chin, S. Yiacoumi, C. Tsouris
Environ. Sci. Technol., 36 (2002) 3, 343-348
2222 Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy
M. Gauthier, R. Perez, T. Arai, M. Tomitori, M. Tsukada
Phys. Rev. Lett., 89 (2002) 14, 146104
2225 Inverting dynamic force microscopy: from signals to time-resolved interaction forces
M. Stark, R. W. Stark, W. M. Heckl, R. Guckenberger
Proc. Natl. Acad. Sci. USA, 99 (2002) 13, 8473-8478
2268 Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy
M. S. Marcus, R. W. Carpick, D. Y. Sasaki, M. A. Eriksson
Phys. Rev. Lett., 88 (2002) 22, 226103
2271 Measuring forces with the AFM: polymeric surfaces in liquids
C. S. Hodges
Adv. Colloid Interface Sci., 99 (2002) 1, 13-75
2278 Membranes at interfaces: structure studies by AFM and time-resolved neutron reflectivity
B. Klosgen, T. Spangenberg, H. Niehus, T. Gutberlet, R. Steitz, G. Fragneto
Cell. Mol. Biol. Lett., 7 (2002) 2, 240
2311 Nonequilibrium statistical mechanics of mixed quantum classical ensembles: application to noncontact atomic force microscopy
L. N. Kantorovich
Phys. Rev. Lett., 89 (2002) 9, 96105
2374 Rupture of molecular thin films observed in atomic force microscopy. I. Theory
H. J. Butt, V. Franz
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 66 (2002) 3/1, 31601
2375 Rupture of molecular thin films observed in atomic force microscopy. II. Experiment
S. Loi, G. Sun, V. Franz, H. J. Butt
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 66 (2002) 3/1, 31602
2376 Sampling effects influence heights measured with atomic force microscopy
J. B. Heymann, C. Moller, D. J. Muller
J. Microsc., 207 (2002) 1, 43-51
2398 Scanning probe microscopy
M. A. Poggi, L. A. Bottomley, P. T. Lillehei
Anal. Chem., 74 (2002) 12, 2851-2862
2428 Spin-polarized scanning tunneling microscopy with antiferromagnetic probe tips
A. Kubetzka, M. Bode, O. Pietzsch, R. Wiesendanger
Phys. Rev. Lett., 88 (2002) 5, 57201
2552 Visualization of thermally fluctuating surface structure in noncontact atomic-force microscopy and tip effects on fluctuation: theoretical study of Si(111)√3×√3-Ag surface
N. Sasaki, S. Watanabe, M. Tsukada
Phys. Rev. Lett., 88 (2002) 4, 46106
2582 Field-dependence of microscopic probes in magnetic force microscopy
K. L. Babcock, V. B. Elings, J. Shi, D. D. Awschalom, and M. Dugas
Appl. Phys. Lett., 69 (1996) 705-707
2568 Measurement of the stray field emanating from magnetic force microscope tips by Hall effect microsensors
A. Thiaville, L. Belliard, D. Majer, E. Zeldov, J. Miltat
J. Appl. Phys., 82 (1997) 7, 3182-3191
2618 The origin and interpretation of fine scale magnetic contrast in magnetic force microscopy: A study using single-crystal NdFeB and a range of magnetic force microscopy tips
M. Al-Khafaji et al.
J. Appl. Phys., 83 (1998) 6411
2617 Magnetic force microscopy of avalanche dynamics in magnetic media
Brian Walsh et al.
J. Appl. Phys., 84 (1998) 5709
2585 Frequency shift of a resonating cantilever in a.c. force microscopy: towards a realistic model
P. Vairac, B. Cretin
Applied Physics A: Materials Science & Processing, 66 (1998) 7, S227-S230
2619 Quantification of magnetic force microscopy images using combined electrostatic and magnetostatic imaging
R. D. Gomez, A. O. Pak, A. J. Anderson, E. R. Burke, A. J. Leyendecker, and I. D. Mayergoyz
J. Appl. Phys., 83 (1998) 11, 6226-6228
2596 Optimization of lateral resolution in magnetic force microscopy
S. Porthun, L. Abelmann, S.J.L. Vellekoop, J.C. Lodder, H.J. Hug
Applied Physics A: Materials Science & Processing, 66 (1998) 7, S1185-S1189
2560 Force spectroscopy in noncontact mode
I.Yu. Sokolov, G.S. Henderson, F.J. Wicks
Applied Surface Science, 140 (1999) 358-361
2578 Phase contrast and surface energy hysteresis in tapping mode scanning force Microscopy
R. Garcia, J.Tamayo and A. San Paulo
Surf. Interface Anal., 27 (1999) 312-316
2601 Force-distance curves by atomic force microscopy
B. Cappella and G. Dietler
Surf. Sci. Rep., 34 (1999) 1-3, 1-3
2611 Range of interactions: An experiment in atomic and magnetic force microscopy
W. L. Murphy et al.
Am. J. Phys., 67 (1999) 905
2612 Quantitative determination of effective dipole and monopole moments of magnetic force microscopy tips
J. Lohau et al.
J. Appl. Phys., 86 (1999) 3410
2614 Observation of the effects of tip magnetization states on magnetic force microscopy images
Paul Rice and Stephen E. Russek
J. Appl. Phys., 85 (1999) 8, 5163-5165
2615 Magnetic dissipation microscopy in ambient conditions
Roger Proksch et al.
Appl. Phys. Lett., 74 (1999) 419
2561 Noise in piezoresistive atomic force microscopy
Ole Hansen and Anja Boisen
Nanotechnology, 10 (1999) 51-60
2604 A method for the calibration of magnetic force microscopy tips
P. J. A. van Schendel, H. J. Hug, B. Stiefel, S. Martin, and H.-J. Guntherodt
J. Appl. Phys., 88 (2000) 435
2571 Dynamics of a vibrating tip near or in intermittent contact with a surface
R. Garcia and A. San Paulo
Phys. Rev. B, 61 (2000) 13381(R)
2605 Quantitative determination of the magnetization and stray field of a single domain Co/Pt dot with magnetic force microscopy
J. Lohau et al.
Appl. Phys. Lett., 76 (2000) 3094
2558 Active Quality Factor Control in Liquids for Force Spectroscopy
A. D. L. Humphris, J. Tamayo, and M. J. Miles
Langmuir, 16 (2000) 7891-7894
2579 Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction
R. Hillenbrand, M. Stark, R. Guckenberger
Appl. Phys. Lett., 76 (2000) 3478-3480
2572 An apertureless near-field scanning optical microscope and its application to surface-enhanced Raman spectroscopy and multiphoton fluorescence imaging
Linda T. Nieman, Gerhard M. Krampert, and Robert E. Martinez
Rev. Sci. Instrum., 72 (2001) 3, 1691-1699
2598 Quantitative interpretation of magnetic force microscopy images from soft patterned elements
J. M. Garcia et al.
Appl. Phys. Lett. 79 (2001) 656
2599 Calibrated magnetic force microscopy measurement of current-carrying lines
R. Yongsunthon, J. McCoy, and E. D. Williams
J. Vac. Sci. Technol., A19 (2001) 4, 1763-1768
2603 Quantitative field measurements from magnetic force microscope tips and comparison with point and extended charge models
S. McVitie, R. P. Ferrier, J. Scott, G. S. White, and A. Gallagher
J. Appl. Phys., 89 (2001) 7, 3656-3661
2562 Tapping mode atomic force microscopy in liquid with an insulated piezoelectric microactuator
B. Rogers, D. York, N. Whisman, M. Jones, K. Murray, and J. D. Adams, T. Sulchek, S. C. Minne
Rev. Sci. Instrum., 73 (2002) 9, 3242-3244
2597 Magnetic force gradient mapping
Tilman E. Schaffer, Manfred Radmacher, and Roger Proksch
J. Appl. Phys. 94 (2003) 10, 6525-6532
2680 Improved atomic force microscopy resolution using an electric double layer
I. Yu. Sokolov, G. S. Henderson, F. J. Wicks, G. A. Ozin
Appl. Phys. Lett., 70 (1997) 7, 844-846
2703 The relation between resonance curves and tip-surface interaction potential in noncontact atomic-force microscopy
Naruo Sasaki and Masaru Tsukada
Jpn. J. Appl. Phys., 37 (1998) Pt2/5A, L533-L535
2678 Self-oscillation mode induced in an atomic force microscope cantilever
Kiwoong Kim and Soonchil Lee
J. Appl. Phys., 91 (2002) 7, 4715-4719
2398 Scanning probe microscopy
M. A. Poggi, L. A. Bottomley, P. T. Lillehei
Anal. Chem., 74 (2002) 12, 2851-2862
2708 Small signal amplification using parametric resonance in NcAFM imaging
Shivprasad Patil, C.V. Dharmadhikari
Appl. Surf. Sci., 217 (2003) 7-15