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 Theory and Practice of SPM
This section comprises references to the articles containing information on theoretical
problems and fundamentals of Scanning Probe Microscopy issued mainly since 1996. Also, a plenty of references to the papers devoted to simulation and modeling experiments, as well as enhancements, improvements and developments of contemporary SPM methods and corresponding techniques are put including those describing technical
innovations and technological solutions.
We purposely do not engage in reviewing
existent theories and models of SPM since such comprehensive and,
on the other hand, highly specialized (in respect to every SPM
method or technique) survey inevitably would inflate into a little
book and should be performed by a group of persons whose experience
in this field has been accumulated during the mature part of the
SPM history.
Most of the references to the articles
devoted to conceptual problems related to biology, probes and
cantilevers are considered mainly in the appropriate sections
of our Library and, as a rule, do not reflected here.
The latest attempt to classify different
SPM methods and techniques probably has been undertaken by Friedbacher
and Fuchs [1261], though some
relatively well established techniques such as Conductive AFM
(or Scanning Spreading Resistance Microscopy, SSRM) are not mentioned
in this paper.
| ID |
Reference list (newly come references are marked
red) |
| 985 |
A fast and versatile scan unit for scanning probe
microscopy.
Knebel D., Amrein M., Voigt K., Reichelt R.
Scanning 19 (1997) 264-268. |
| 10 |
A mechanical approach to the dissipation process
in NC-AFM: experiments, model and simulation
G. Couturier, J.P. Aime, J. Salardenne, R. Boisgard, A. Gourdon, S.
Gauthier
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S47-S50 |
| 801 |
A method to improve the quantitative analysis of
SFM images at the nanoscale
B.A. Todd, S.J. Eppell
Surface Science, 491 (2001), 3, 473-483 |
| 802 |
A metrological scanning force microscope
X. Y., S.T. Smith, P.D. Atherton
Precision Engineering, 19 (1996), 1, 46-55 |
| 803 |
A new approach to pH of point of zero charge measurement:
crystal-face specificity by scanning force microscopy (SFM) - A new
approach to the measurement of adsorption isotherms at the solid-liquid
interface
G. Jordan, C.M. Eggleston
Geochimica et Cosmochimica Acta, 62 (1998), 11, 1919-1923 |
| 270 |
A tower-shaped prototypic molecule designed as
an atomically sharp tip for AFM applications
A.V. Rukavishnikov, M.D. Lee, A. Phadke, D.H. LaMunyo, P.A. Petukhov,
J.F. Keana
Tetrahedron Letters, 40 (1999), 35, 6353-6356 |
| 794 |
Adhesion forces between individual ligand-receptor
pairs
Florin E-L., Moy V.T. and Gaub E.H.
Science 264 (1994), 415-417 |
| 282 |
AFM for the imaging of large and steep submicroscopic
features, artifacts and scraping with asymmetric cantilever tips
G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M.
Plagmann
Thin Solid Films, 264 (1995), 2, 205-211 |
| 213 |
AFM imaging with an xy-micropositioner with integrated
tip
P.-F. Indermuhle, V.P. Jaecklin, J. Brugger, C. Linder, N.F. De Rooij,
M. Binggeli
Sensors and Actuators A: Physical, 47 (1995), 1-3, 562-565 |
| 194 |
AFM observations and simulations of jarosite growth
at the molecular scale: probing the basis for the incorporation of
foreign ions into jarosite as a storage mineral
U. Becker, B. Gasharova
Physics and Chemistry of Minerals, 28 (2001), 8, 545-556 |
| 1645 |
Algorithms for scanned probe microscope image simulation,
surface reconstruction, and tip estimation
J. S. Villarrubia
J. Res. Natl. Inst. Stand. Technol. 102, (1997), 4, 425-454 |
| 307 |
Ambient atomic force microscopy images of stilbite
and their interpretation by molecular simulations
M. Komiyama, A. Miyamoto, Y. Oumi, M. Kubo, K. Tsujimichi
Applied Surface Science, 121-122 (1997), 543-547 |
| 308 |
Amplitude, deformation and phase shift in amplitude
modulation atomic force microscopy: a numerical study for compliant
materials
A. San Paulo, R. Garca
Surface Science, 471 (2001), 1-3, 71-79 |
| 320 |
AN02/DNP-hapten unbinding forces studied by molecular
dynamics atomic force microscopy simulations
B. Heymann, H. Grubmuller
Chemical Physics Letters, 303 (1999), 1-2, 1-9 |
| 323 |
Analytical evaluation of tapping mode atomic force
microscopy for chemical imaging of surfaces
B. Basnar, G. Friedbacher, H. Brunner, T. Vallant, U. Mayer, H. Hoffmann
Applied Surface Science, 171 (2001), 3-4, 213-225 |
| 1008 |
Application of neural networks to a scanning probe
microscopy system
L. Hadjiiski, R. Linnemann, M. Stopka, E. Oesterschulze, I. Rangelow,
R. Kassing
Thin Solid Films, 264 (1995), 2, 291-297 |
| 812 |
Atomic and chemical resolution in scanning force
microscopy on ionic surfaces
A.L. Shluger, A.I. Livshits
Applied Surface Science, 141 (1999), 3-4, 274-286 |
| 1638 |
Atomic-force microscopy probe tip visualization
and improvement of images using a simple deconvolution procedure
P. Markiewicz and M. C. Goh
Langmuir 10 (1994), 5 |
| 435 |
Atomistic simulations of fluid structure and solvation
forces in atomic force microscopy
D.L. Patrick, R.M. Lynden-Bell
Surface Science, 380 (1997), 2-3, 224-244 |
| 1011 |
Automated detection of particles, clusters and
islands in scanning probe microscopy images
M.J.J. Jak, C. Konstapel, A. van Kreuningen, J. Verhoeven, R. van
Gastel, J.W.M. Frenken
Surface Science, 494 (2001), 2, 43-52 |
| 814 |
Background correction in scanning probe microscope
recordings of macromolecules
J.P.P. Starink, T.M. Jovin
Surface Science, 359 (1996), 1-3, 291-305 |
| 437 |
Bias dependence of Si(111)7x7 images observed by
noncontact atomic force microscopy
T. Arai, M. Tomitori
Applied Surface Science, 157 (2000), 4, 207-211 |
| 817 |
Bridge configuration of piezoresistive devices
for scanning force microscopes
O. Ohlsson, J. Schelten, R. Jumpertz, F. Saurenbach
Sensors and Actuators A: Physical, 70 (1998), 1-2, 88-91 |
| 1104 |
Calculation of playback signals from MFM images
using transfer functions
S.J.L. Vellekoop, J.J. Miles, J.C. Lodder, L. Abelmann, S. Porthun
Journal of Magnetism and Magnetic Materials, 193 (1999), 1-3, 474-478 |
| 438 |
Calculation of the optimal imaging parameters for
frequency modulation atomic force microscopy
S. Hembacher, H. Bielefeldt, F.J. Giessibl, J. Mannhart
Applied Surface Science, 140 (1999), 3-4, 352-357 |
| 1012 |
Calibration of transfer standards for SPM
L. Koenders, G.-S. Peng, Gao-Feng
Microelectronic Engineering, 41-42 (1998), 615-618 |
| 820 |
Characterization of an integrated force sensor
based on a MOS transistor for applications in scanning force microscopy
N.F. De Rooij, J. Brugger, A. Tonin, P. Vettiger, T. Akiyama,
U. Staufer, H.-R. Hidber
Sensors and Actuators A: Physical, 64 (1998), 1, 1-6 |
| 1261 |
Classification of Scanning Probe Microscopies
Gernot Friedbacher and Harald Fuchs
Pure Appl. Chem., 71 (1999), 7, pp. 1337-1357 |
| 1108 |
Comparing the resolution of magnetic force microscopes
using the CAMST reference samples
L. Abelmann, B. Stiefel, K. Babcock, P.J.A. van Schendel, R. Proksch,
H.J. Hug, M.E. Best, A. Farley, C. Lodder, M. Haast, T. Pfaffelhuber,
G.P. Heydon, A. Moser, S.R. Hoon, S. Porthun
Journal of Magnetism and Magnetic Materials, 190 (1998), 1-2, 135-147 |
| 1635 |
Computational model of the imaging process in scanning-x
microscopy
H. Gallarda and R. Jain
Proceedings of Conference on Integrated Circuit Metrology, Inspection,
and Process Control, V, SPIE Vol. 1464 (1991), 459. |
| 22 |
Contact resonance imaging - a simple approach to
improve the resolution of AFM for biological and polymeric materials
K. Wadu-Mesthrige, N.A. Amro, J.C. Garno, S. Cruchon-Dupeyrat,
G.-Y. Liu
Applied Surface Science, 175-176 (2001), 391-398 |
| 7 |
Contrast inversion in nc-AFM on Si(111)7x7 due
to short-range electrostatic interactions
M. Guggisberg, O. Pfeiffer, S. Schar, V. Barwich, M. Bammerlin,
C. Loppacher, R. Bennewitz, A. Baratoff, E. Meyer
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S19-S22 |
| 38 |
Contrast mechanism in non-contact AFM on reactive
surfaces
K. Terakura, R. Perez, I. Stich, M.C. Payne
Applied Surface Science, 123-124 (1998), 249-254 |
| 824 |
Contrast mechanism in non-contact SFM imaging of
ionic surfaces
A.I. Livshits, A.L. Shluger, A.L. Rohl
Applied Surface Science, 140 (1999), 3-4, 327-332 |
| 463 |
Corrections to the van der Waals forces in application
to atomic force microscopy
M. Bordag, G.L. Klimchitskaya, V.M. Mostepanenko
Surface Science, 328 (1995), 1-2, 129-134 |
| 465 |
Correlation between frequency-sweep hysteresis
and phase imaging instability in tapping mode atomic force microscopy
G. Bar, R. Brandsch, M.-H.M.-H. Whangbo
Surface Science, 436 (1999), 1-3, L715-L723 |
| 973 |
Deformation, contact time, and phase-contrast in
tapping mode scanning force microscopy
Tamayo J., Garcia R.
Langmuir 12 (1996), 4430-4435 |
| 830 |
Dependence of the measured monolayer height on
applied forces in scanning force microscopy
X.D. Liu, M. Hartig, L.F. Chi, H. Fuchs
Thin Solid Films, 327-329 (1998), 262-267 |
| 1110 |
Description of magnetic force microscopy by three-dimensional
tip Green's function for sample magnetic charges
H. Saito, S. Ishio, J. Chen
Journal of Magnetism and Magnetic Materials, 191 (1999), 1-2, 153-161 |
| 468 |
Description of phase imaging in tapping mode atomic
force microscopy by harmonic approximation
M.-H. Whangbo, R. Brandsch, G. Bar
Surface Science, 411 (1998), 1-2, L794-L801 |
| 469 |
Design and application of scanning near-field optical/atomic
force microscopy
T. Ataka, H. Muramatsu, K. Nakajima, N. Chiba, K. Homma, M. Fujihara
Thin Solid Films, 273 (1996), 1-2, 154-160 |
| 1604 |
Determining the form of atomic force microscope
tips
P. Siedle, H-J. Butt. E.Bamberg, D.N. Wang, W. Kuhlbrand, J. Zach
and M. Haider
Int. Phys. Conf. Ser. 130 (1993) 361 |
| 499 |
Examination of the relationship between phase shift
and energy dissipation in tapping mode atomic force microscopy by
frequency-sweep and force-probe measurements
L. Delineau, G. Bar, R. Brandsch, M. Bruch, M.-H. Whangbo
Surface Science, 444 (2000), 1-3, L11-L16 |
| 75 |
Fine atomic image of mica cleavage planes obtained
with an atomic force microscope (AFM) and a novel procedure for image
processing
M. Baba, S. Kakitani, H. Ishii, T. Okuno
Chemical Physics, 221 (1997), 1-2, 23-31 |
| 504 |
Fourier transformed atomic force microscopy: tapping
mode atomic force microscopy beyond the Hookian approximation
R.W. Stark, W.M. Heckl
Surface Science, 457 (2000), 1-2, 219-228 |
| 1023 |
Fractal analysis of scanning probe microscopy images
N. Almqvist
Surface Science, 355 (1996), 1-3, 221-228 |
| 507 |
Frequency modulation detection atomic force microscopy
in the liquid environment
S.P. Jarvis, T. Ishida, T. Uchihashi, Y. Nakayama, H. Tokumoto
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S129-S132 |
| 508 |
Frequency shift and energy dissipation in non-contact
atomic-force microscopy
S.H. Ke, T. Uda, K. Terakura
Applied Surface Science, 157 (2000), 4, 361-366 |
| 518 |
Guidelines for the achievement of true atomic resolution
with noncontact atomic force microscopy
Y. Sugawara, S. Morita
Applied Surface Science, 140 (1999), 3-4, 406-410 |
| 519 |
Harmonic responses of a cantilever interacting
with elastomers in tapping mode atomic force microscopy
M.-H. Whangbo, G. Bar, R. Brandsch, L. Delineau
Surface Science, 448 (2000), 1, L179-L187 |
| 250 |
How to describe AFM constant force surfaces in
repulsive mode?
E.V. Blagov, G.L. Klimchitskaya, A.A. Lobashov, V.M. Mostepanenko
Surface Science, 349 (1996), 2, 196-206 |
| 524 |
How to measure energy dissipation in dynamic mode
atomic force microscopy
H. Fuchs, V.B. Elings, B. Anczykowski, J.P. Cleveland, B. Gotsmann
Applied Surface Science, 140 (1999), 3-4, 376-382 |
| 45 |
Imaging of chemical reactivity and buckled dimers
on Si(100)2x1 reconstructed surface with noncontact AFM
T. Tsukamoto, T. Okada, T. Minobe, Y. Sugawara, T. Uchihashi,
S. Orisaka, S. Morita
Applied Surface Science, 140 (1999), 3-4, 304-308 |
| 8 |
Imaging problems on insulators: What can be learnt
from NC-AFM modelling on CaF2
A.S. Foster, A.L. Rohl, A.L. Shluger
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S31-S34 |
| 225 |
Impact of atomic relaxation on the breaks of constant
force surfaces in AFM
E.V. Blagov, G.L. Klimchitskaya, V.M. Mostepanenko
Surface Science, 410 (1998), 2-3, 158-169 |
| 14 |
Instrumentation of STM and AFM combined with transmission
electron microscope
D. Erts, A. Lohmus, R. Lohmus, H. Olin
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S71-S74 |
| 52 |
Interaction measurements between a tip and a sample
in proximity regions controlled by tunneling current in a UHV STM-AFM
M. Tomitori, T. Arai
Applied Surface Science, 144-145 (1999), 501-504 |
| 837 |
Intercomparison of SEM, AFM, and Electrical Linewidths
J. S. Villarrubia, R. Dixson, S. Jones, J. R. Lowney, M. T. Postek,
R. A. Allen, and M. W. Cresswell
Metrology, Inspection, and Process Control for Microlithography
XIII, Proc. SPIE 3677 (1999), pp. 587-598 |
| 1308 |
Lateral force microscopy - A quantitative approach
G.S. Watson, S. Myhra, C.T. Gibson
Wear, 213 (1997), 1-2, 72-79 |
| 786 |
Limits of force microscopy
Smith, D.P.E.
Rev. Sci. Instrum. 66 (1995), 3191-3195 |
| 1033 |
Melnikov-Based Dynamical Analysis of Microcantilevers
in Scanning Probe Microscopy
M. Ashhab, M. V. Salapaka, M. Dahleh, I. Mezic
Nonlinear Dynamics, 20 (1999), 3, 197-220 |
| 1603 |
Mesoscopic Calibration of an Atomic Force Microscope
S.S. Sheiko, M. Moller, E.M.C.M. Reuvekamp and H.W. Zandbergen
Ultramicroscopy 53 (1994) 371-380 |
| 231 |
Model dependence of AFM simulations in non-contact
mode
I.Y. Sokolov, G.S. Henderson, F.J. Wicks
Surface Science, 457 (2000), 1-2, 267-272 |
| 612 |
Molecular dynamics simulation of atomic force microscopy:
imaging single-atom vacancies on Ag(001) and Pt(001)
M. Katagiri, R.M. Lynden-Bell, D.L. Patrick
Surface Science, 431 (1999), 1-3, 260-268 |
| 881 |
Molecular dynamics study of scanning force microscopy
on self-assembled monolayers
T. Bonner, A. Baratoff
Surface Science, 377-379 (1997), 1082-1086 |
| 632 |
Nanoparticle sizing: a comparative study using
atomic force microscopy, transmission electron microscopy, and ferromagnetic
resonance
L.M. Lacava, B.M. Lacava, R.B. Azevedo, Z.G.M. Lacava, N. Buske,
A.L. Tronconi, P.C. Morais
Journal of Magnetism and Magnetic Materials, 225 (2001), 1-2, 79-83 |
| 318 |
Normal and lateral force investigation using magnetically
activated force sensors
S.P. Jarvis, H. Yamada, K. Kobayashi, A. Toda, H. Tokumoto
Applied Surface Science, 157 (2000), 4, 314-319 |
| 1450 |
Novel nanoindentation method for characterising
multiphase materials
N.X. Randall, C. Julia-Schmutz, J.M. Soro, J. von Stebut, G. Zacharie
Thin Solid Films, 308-309 (1997), 1-4, 297-303 |
| 656 |
Observation of voltage contrast in non contact
resonant mode Atomic Force Microscopy
P. Girard, G.C. Solal, S. Belaidi
Microelectronic Engineering, 31 (1996), 1-4, 215-225 |
| 659 |
On possibility of spin-polarized atomic force microscopy
H.J. Reittu
Surface Science, 334 (1995), 1-3, 257-262 |
| 664 |
Phase change detection of attractive force gradient
by using a quartz resonator in noncontact atomic force microscopy
R. Nishi, I. Houda, T. Aramata, Y. Sugawara, S. Morita
Applied Surface Science, 157 (2000), 4, 332-336 |
| 665 |
Phase imaging and stiffness in tapping-mode atomic
force microscopy
M.-H. Whangbo, S.N. Magonov, V. Elings
Surface Science, 375 (1997), 2-3, l385-l391 |
| 32 |
Phase imaging as an extension to tapping mode AFM
for the identification of material properties on humidity-sensitive
surfaces
I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer
Applied Surface Science, 115 (1997), 2, 190-198 |
| 1452 |
Progress in determination of the area function
of indenters used for nanoindentation
K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seemann
Thin Solid Films, 377-378 (2000), 394-400 |
| 156 |
Proposal for new atomic force microscopy (AFM)
imaging for a high aspect structure (digital probing mode AFM)
S. Hosaka, T. Morimoto, K. Kuroda, H. Kunitomo, T. Hiroki, T.
Kitsukawa, S. Miwa, H. Yanagimoto, K. Murayama
Microelectronic Engineering, 57-58 (2001), 651-657 |
| 48 |
Pseudo-non-contact AFM imaging?
F.J. Wicks, G.S. Henderson, I.Y. Sokolov
Applied Surface Science, 140 (1999), 3-4, 362-365 |
| 62 |
Quantitative electrostatic force measurement in
AFM
S. Jeffery, A. Oral, J.B. Pethica
Applied Surface Science, 157 (2000), 4, 280-284 |
| 221 |
Quantum oscillations in surface-tip transfer of
adatoms on AFM/STM with a dissipative environment
I.S. Tilinin, M.A. Van Hove, M. Salmeron
Surface Science, 393 (1997), 1-3, l88-l92 |
| 897 |
Resonance modes of voltage-modulated scanning force
microscopy
M. Labardi, V. Likodimos, M. Allegrini
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S79-S85 |
| 1636 |
Restoration of scanning probe microscope images
G. S. Pingali and R. Jain
Proceedings IEEE Workshop on Applications of Computer Vision, (1992)
pp. 282-289. |
| 251 |
Role of the adhesion between a nanotip and a soft
material in tapping mode AFM
F. Dubourg, J.P. Aime
Surface Science, 466 (2000), 1-3, 137-143 |
| 898 |
Role of the force of friction on curved surfaces
in scanning force microscopy
J.P. Aime, Z. Elkaakour, S. Gauthier, D. Michel, T. Bouhacina, J.
Curely
Surface Science, 329 (1995), 1-2, 149-156 |
| 29 |
Roughness fractal approach of oxidised surfaces
by AFM and diffuse X-ray reflectometry measurements
J.C. Arnault, A. Knoll, E. Smigiel, A. Cornet
Applied Surface Science, 171 (2001), 3-4, 189-196 |
| 984 |
Scan speed limit in atomic force microscopy
Butt H.J., Siedle P., Seifert K., Fendler K., Seeger T., Bamberg E.,
Weisenhorn A.L., Goldie K., Engel A.
J. Microsc. 169 (1993), 75-84 |
| 916 |
Scanning force microscopy simulations of well-characterized
nanostructures on dielectric and semiconducting substrates
G. Cohen-Solal, F. Touhari, X. Bouju, M. Devel, C. Girard
Applied Surface Science, 125 (1998), 3-4, 351-359 |
| 1633 |
Scanning tunneling microscopy on rough surfaces-deconvolution
of constant current images
G. Reiss, F. Schneider, J. Vancea, and H. Hoffmann
Appl. Phys. Lett. 57, (1990), 867 |
| 63 |
Self-assembled monolayers containing biphenyl derivatives
as challenge for nc-AFM
A. Nakasa, U. Akiba, M. Fujihira
Applied Surface Science, 157 (2000), 4, 326-331 |
| 921 |
Self-excited force-sensing microcantilevers with
piezoelectric thin films for dynamic scanning force microscopy
T. Itoh, T. Suga
Sensors and Actuators A: Physical, 54 (1996), 1-3, 477-481 |
| 30 |
Simulated nc-AFM images of Si(001) surface with
nanotube tip
K. Tagami, N. Sasaki, M. Tsukada
Applied Surface Science, 172 (2001), 3-4, 301-306 |
| 245 |
Simulation of AFM/LFM by molecular dynamics: Role
of lateral force in contact-mode AFM imaging
M. Komiyama, K. Tsujimichi, K. Tazawa, A. Hirotani, H. Yamano, A.
Miyamoto, E. Broclawik, M. Kubo
Surface Science, 357-358 (1996), 222-227 |
| 698 |
Simulation of atomic force microscopy image variations
due to tip apex size: Appearance of half spots
M. Komiyama, K. Tazawa, K. Tsujimichi, A. Hirotani, M. Kubo, A. Miyamoto
Thin Solid Films, 281-282 (1996), 1-2, 580-583 |
| 243 |
Simulation of interaction force between Si tip
and Si(111)√3×√3-Ag surface of IET structure in
noncontact AFM
N. Sasaki, S. Watanabe, H. Aizawa, M. Tsukada
Surface Science, 493 (2001), 1-3, 188-193 |
| 9 |
Simulation of NC-AFM images of xenon(111)
H. Holscher, W. Allers, U.D. Schwarz, A. Schwarz, R. Wiesendanger
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S35-S38 |
| 11 |
Simultaneous imaging of tunneling current and damping
energy by noncontact-AFM in ultra-high vacuum
T. Arai, M. Tomitori
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S51-S54 |
| 927 |
Spin-contrast in non-contact SFM on oxide surfaces:
theoretical modelling of NiO(001) surface
A.S. Foster, A.L. Shluger
Surface Science, 490 (2001), 1-2, 211-219 |
| 929 |
Strength measurement and calculations on silicon-based
nanometric oscillators for scanning force microcopy operating in the
gigahertz range
H. Kawakatsu, H. Toshiyoshi, D. Saya, K. Fukushima, H. Fujita
Applied Surface Science, 157 (2000), 4, 320-325 |
| 972 |
Studies of vibrating atomic force microscope cantilevers
in liquid
Schaeffer T.E., Cleveland J.P., Ohnesorge F.M., Walters D.A., Hansma
P.K.
J Appl Phys 80 (1996), 3622-3627. |
| 933 |
Study of tip-sample interaction in scanning force
microscopy
M. Luna, J. Colchero, J. Gomez-Herrero, A.M. Baro
Applied Surface Science, 157 (2000), 4, 285-289 |
| 1070 |
Surface analysis algorithms for scanning probe
microscopy
C. Lindquist, F.K. Urban, C.S. Lindquist, F.K.I. Urban
Thin Solid Films, 270 (1995), 1-2, 399-405 |
| 938 |
Surface roughness of thin layers - A comparison
of XRR and SFM measurements
Z. Stachura, M. Lekka, O. Filies, J. Lekki, O. Boling, K. Grewer,
B. Cleff
Applied Surface Science, 141 (1999), 3-4, 357-365 |
| 233 |
The contrast mechanism for true atomic resolution
by AFM in non-contact mode: Quasi-non-contact mode?
I.Y. Sokolov, G.S. Henderson, F.J. Wicks
Surface Science, 381 (1997), 1, l558-l562 |
| 244 |
The height dependence of image contrast when imaging
by non-contact AFM
I.Y. Sokolov, G.S. Henderson
Surface Science, 464 (2000), 2-3, L745-L751 |
| 12 |
The measurement of hysteretic forces by dynamic
AFM
B. Gotsmann, H. Fuchs
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S55-S58 |
| 766 |
The role of damping in phase imaging in tapping
mode atomic force microscopy
L. Wang
Surface Science, 429 (1999), 1-3, 178-185 |
| 950 |
The role of shear forces in scanning force microscopy:
a comparison between the jumping mode and tapping mode
F. Moreno-Herrero, P.J. de Pablo, J. Colchero, J. Gomez-Herrero,
A.M. Baro
Surface Science, 453 (2000), 1-3, 152-158 |
| 769 |
Theoretical analysis of atomic-scale friction infrictional-force
microscopy
N. Sasaki, M. Tsukada, S. Fujisawa, Y. Sugawara, S. Morita
Tribology Letters, 4 (1998), 2, 125-128 |
| 770 |
Theoretical evaluation of the frequency shift and
dissipated power in noncontact atomic force microscopy
N. Sasaki, M. Tsukada
Applied Physics A: Materials Science & Processing, 72 (2001),
7, S39-S42 |
| 771 |
Theoretical simulation of atomic-scale friction
in atomic force microscopy
N. Sasaki, K. Kobayashi, M. Tsukada
Surface Science, 357-358 (1996), 92-95 |
| 64 |
Theoretical simulation of noncontact AFM images
of Si(111)√3×√3-Ag surface based on Fourier expansion
method
N. Sasaki, H. Aizawa, M. Tsukada
Applied Surface Science, 157 (2000), 4, 367-372 |
| 47 |
Theory for the effect of the tip-surface interaction
potential on atomic resolution in forced vibration system of noncontact
AFM
N. Sasaki, M. Tsukada
Applied Surface Science, 140 (1999), 3-4, 339-343 |
| 775 |
Time-frequency modeling of atomic force microscopy
D. Dragoman, M. Dragoman
Optics Communications, 140 (1997), 4-6, 220-225 |
| 1362 |
STM studies: spatial resolution limits to fit observations
in nanotechnology
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S. Wielert-Badt, VPh Pastushenko
Ultramicroscopy, 82 (2000) 1-4, 227-235 |
| 2397 |
Scanning probe microscopy
P. T. Lillehei, L. A. Bottomley
Anal. Chem., 72 (2000) 12, 189R-196R |
| 2409 |
Shear modulation force microscopy study of near
surface glass transition temperatures
S. Ge, Y. Pu, W. Zhang, M. Rafailovich, J. Sokolov, C. Buenviaje,
R. Buckmaster, R. M. Overney
Phys. Rev. Lett., 85 (2000) 11, 2340-2343 |
| 2437 |
Structure and spectroscopy of surface defects
from scanning force microscopy: theoretical predictions
L. N. Kantorovich, A. L. Shluger, A. M. Stoneham
Phys. Rev. Lett., 85 (2000) 18, 3846-3849 |
| 2516 |
Topographic and phase-contrast imaging in atomic
force microscopy
G. K. Pang, K. Z. Baba-Kishi, A. Patel
Ultramicroscopy, 81 (2000) 2, 35-40 |
| 1854 |
A sample scanning system with nanometric accuracy
for quantitative SPM measurements
G. B. Picotto, M. Pisani
Ultramicroscopy, 86 (2001) 1-2, 247-254 |
| 1911 |
Atomic force microscopy applications in macromolecular
crystallography
A. McPherson, A. J. Malkin, Y. G. Kuznetsov, M. Plomp
Acta Crystallogr. D: Biol. Crystallogr., 57 (2001) 8, 1053-1060 |
| 1821 |
ATOMIC FORCE MICROSCOPY: You may squeeze the
atoms but don't mangle the surface!
Alex de Lozanne
Science, 291 (2001) 2561-2562 |
| 1996 |
Can atomic force microscopy achieve atomic resolution
in contact mode?
M. R. Jarvis, R. Perez, M. C. Payne
Phys. Rev. Lett., 86 (2001) 7, 1287-1290 |
| 2036 |
Combining AFM and FRET for high resolution fluorescence
microscopy
S. A. Vickery, R. C. Dunn
J. Microsc., 202 (2001) 2, 408-412 |
| 2066 |
Detachment of Particles from Surfaces: An AFM
Study
A. M. Freitas, M. M. Sharma
J. Colloid. Interface. Sci., 233 (2001) 1, 73-82 |
| 2106 |
Effect of Gravity on Colloidal Deposition Studied
by Atomic Force Microscopy
E. Dokou, M. A. Barteau, N. J. Wagner, A. M. Lenhoff
J. Colloid. Interface. Sci., 240 (2001) 1, 9-16 |
| 2122 |
Energy dissipation in atomic force microscopy
and atomic loss processes
P. M. Hoffmann, S. Jeffery, J. B. Pethica, H. O. Ozer, A. Oral
Phys. Rev. Lett., 87 (2001) 26, 265502 |
| 2131 |
Examination of line crossings by atomic force
microscopy
S. Kasas, A. Khanmy-Vital, G. Dietler
Forensic. Sci. Int., 119 (2001) 3, 290-298 |
| 2144 |
Force measurements on single molecular contacts
through evanescent wave microscopy
G. Zocchi
Biophys. J., 81 (2001) 5, 2946-2953 |
| 2200 |
Implementation of self-sensing SPM cantilevers
for nano-force measurement in microrobotics
S. Fahlbusch, S. Fatikow
Ultramicroscopy, 86 (2001) 1-2, 181-190 |
| 2217 |
Integrating an ultramicroelectrode in an AFM
cantilever: combined technology for enhanced information
C. Kranz, G. Friedbacher, B. Mizaikoff, A. Lugstein, J. Smoliner,
E. Bertagnolli
Anal. Chem., 73 (2001) 11, 2491-2500 |
| 2219 |
Interfacial water dielectric-permittivity-profile
measurements using atomic force microscopy
O. Teschke, G. Ceotto, E. F. de Souza
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 64 (2001) 1-1,
11605 |
| 2221 |
Intermittent contact AFM using the higher modes
of weak cantilever
A. Ulcinas, V. Snitka
Ultramicroscopy, 86 (2001) 1-2, 217-222 |
| 2230 |
Investigation of crossed SAW fields by scanning
acoustic force microscopy
G. Behme, T. Hesjedal
IEEE Trans. Ultrason. Ferroelectr. Freq. Control., 48 (2001) 4,
1132-1138 |
| 1834 |
Nanotweezers Consisting of Carbon Nanotubes
Operating in an Atomic Force Microscope
S. Akita, Y. Nakayama, S. Mizooka, Y. Takano, T. Okawa, Y. Miyatake,
S. Yamanaka, M. Tsuji and T. Nosaka
Appl. Phys. Lett., 79 (2001) 1691-1693 |
| 2310 |
Noncontact electrochemical imaging with combined
scanning electrochemical atomic force microscopy
J. V. Macpherson, P. R. Unwin
Anal. Chem., 73 (2001) 3, 550-557 |
| 2361 |
Quantitative Analysis of Fluid Interface-Atomic
Force Microscopy
D. E. Aston, J. C. Berg
J. Colloid. Interface. Sci., 235 (2001) 1, 162-169 |
| 2377 |
Scaling-index method as an image processing
tool in scanning-probe microscopy
F. Jamitzky, R. W. Stark, W. Bunk, S. Thalhammer, C. Rath, T.
Aschenbrenner, G. E. Morfill, W. M. Heckl
Ultramicroscopy, 86 (2001) 1-2, 241-246 |
| 2406 |
Semi-automatized processing of AFM force-spectroscopy
data
C. Gergely, B. Senger, J. C. Voegel, J. K. Horber, P. Schaaf,
J. Hemmerle
Ultramicroscopy, 87 (2001) 1-2, 67-78 |
| 2411 |
Silicon technology-based micro-systems for atomic
force microscopy/photon scanning tunnelling microscopy
P. Gall-Borrut, B. Belier, P. Falgayrettes, M. Castagne, C. Bergaud,
P. Temple-Boyer
J. Microsc., 202 (2001) 1, 34-38 |
| 2431 |
Static Method to Evaluate Interaction Forces
by AFM
N. Ishida, M. Sakamoto, M. Miyahara, K. Higashitani
J. Colloid. Interface. Sci., 235 (2001) 1, 190-193 |
| 2497 |
The saga of AFM
C. M. Harris
Anal. Chem., 73 (2001) 21, 627A-635A |
| 2505 |
Thermal enhancement of AFM phase contrast for
imaging diblock copolymer thin film morphology
M. J. Fasolk, A. M. Mayes, N. Magonov
Ultramicroscopy, 90 (2001) 1, 21-31 |
| 2506 |
Thermomechanical noise of a free v-shaped cantilever
for atomic-force microscopy
R. W. Stark, T. Drobek, W. M. Heckl
Ultramicroscopy, 86 (2001) 1-2, 207-215 |
| 2531 |
Unambiguous interpretation of atomically resolved
force microscopy images of an insulator
A. S. Foster, C. Barth, A. L. Shluger, M. Reichling
Phys. Rev. Lett., 86 (2001) 11, 2373-2376 |
| 1849 |
A novel sample holder allowing atomic force
microscopy on transmission electron microscopy specimen grids: repetitive,
direct correlation between AFM and TEM images
A. C. Lin, M. C. Goh
J. Microsc., 205 (2002) 2, 205-208 |
| 1891 |
Analysis of matrix dynamics by atomic force
microscopy
H. G. Hansma, D. O. Clegg, E. Kokkoli, E. Oroudjev, M. Tirrell
Methods Cell Biol., 69 (2002) 163-193 |
| 1956 |
Atomic force microscopy probes go electrochemical
C. E. Gardner, J. V. Macpherson
Anal. Chem., 74 (2002) 21, 576A-584A |
| 2037 |
Comment on "Damping mechanism in dynamic
force microscopy"
H. Holscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs,
R. Wiesendanger
Phys. Rev. Lett., 88 (2002) 1, 19601 |
| 2050 |
Contact mechanics modeling of pull-off measurements:
effect of solvent, probe radius, and chemical binding probability
on the detection of single-bond rupture forces by atomic force microscopy
H. Skulason, C. D. Frisbie
Anal. Chem., 74 (2002) 13, 3096-3104 |
| 2079 |
Developments in dynamic force microscopy and
spectroscopy
A. D. Humphris, M. J. Miles
Methods Cell Biol., 68 (2002) 337-355 |
| 2102 |
Dynamic simulations of adhesion and friction
in chemical force microscopy
Y. Leng, S. Jiang
J. Am. Chem. Soc., 124 (2002) 39, 11764-11770 |
| 2126 |
Evaluation of the contact resonance frequencies
in atomic force microscopy as a method for surface characterisation
U. Rabe, M. Kopycinska, S. Hirsekorn, W. Arnold
Ultrasonics, 40 (2002) 1-8, 49-54 |
| 2213 |
Influence of metal ion sorption on colloidal
surface forces measured by atomic force microscopy
C. J. Chin, S. Yiacoumi, C. Tsouris
Environ. Sci. Technol., 36 (2002) 3, 343-348 |
| 2222 |
Interplay between nonlinearity, scan speed,
damping, and electronics in frequency modulation atomic-force microscopy
M. Gauthier, R. Perez, T. Arai, M. Tomitori, M. Tsukada
Phys. Rev. Lett., 89 (2002) 14, 146104 |
| 2225 |
Inverting dynamic force microscopy: from signals
to time-resolved interaction forces
M. Stark, R. W. Stark, W. M. Heckl, R. Guckenberger
Proc. Natl. Acad. Sci. USA, 99 (2002) 13, 8473-8478 |
| 2268 |
Material anisotropy revealed by phase contrast
in intermittent contact atomic force microscopy
M. S. Marcus, R. W. Carpick, D. Y. Sasaki, M. A. Eriksson
Phys. Rev. Lett., 88 (2002) 22, 226103 |
| 2271 |
Measuring forces with the AFM: polymeric surfaces
in liquids
C. S. Hodges
Adv. Colloid Interface Sci., 99 (2002) 1, 13-75 |
| 2278 |
Membranes at interfaces: structure studies by
AFM and time-resolved neutron reflectivity
B. Klosgen, T. Spangenberg, H. Niehus, T. Gutberlet, R. Steitz,
G. Fragneto
Cell. Mol. Biol. Lett., 7 (2002) 2, 240 |
| 2311 |
Nonequilibrium statistical mechanics of mixed
quantum classical ensembles: application to noncontact atomic force
microscopy
L. N. Kantorovich
Phys. Rev. Lett., 89 (2002) 9, 96105 |
| 2374 |
Rupture of molecular thin films observed in
atomic force microscopy. I. Theory
H. J. Butt, V. Franz
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 66 (2002) 3/1,
31601 |
| 2375 |
Rupture of molecular thin films observed in
atomic force microscopy. II. Experiment
S. Loi, G. Sun, V. Franz, H. J. Butt
Phys. Rev. E: Stat. Nonlin. Soft. Matter. Phys., 66 (2002) 3/1,
31602 |
| 2376 |
Sampling effects influence heights measured
with atomic force microscopy
J. B. Heymann, C. Moller, D. J. Muller
J. Microsc., 207 (2002) 1, 43-51 |
| 2398 |
Scanning probe microscopy
M. A. Poggi, L. A. Bottomley, P. T. Lillehei
Anal. Chem., 74 (2002) 12, 2851-2862 |
| 2428 |
Spin-polarized scanning tunneling microscopy
with antiferromagnetic probe tips
A. Kubetzka, M. Bode, O. Pietzsch, R. Wiesendanger
Phys. Rev. Lett., 88 (2002) 5, 57201 |
| 2552 |
Visualization of thermally fluctuating surface
structure in noncontact atomic-force microscopy and tip effects on
fluctuation: theoretical study of Si(111)√3×√3-Ag
surface
N. Sasaki, S. Watanabe, M. Tsukada
Phys. Rev. Lett., 88 (2002) 4, 46106 |
| 2582 |
Field-dependence of microscopic probes in magnetic force
microscopy
K. L. Babcock, V. B. Elings, J. Shi, D. D. Awschalom, and M. Dugas
Appl. Phys. Lett., 69 (1996) 705-707 |
| 2568 |
Measurement of the stray field emanating from magnetic
force microscope tips by Hall effect microsensors
A. Thiaville, L. Belliard, D. Majer, E. Zeldov, J. Miltat
J. Appl. Phys., 82 (1997) 7, 3182-3191 |
| 2618 |
The origin and interpretation of fine scale magnetic contrast
in magnetic force microscopy: A study using single-crystal NdFeB and a range
of magnetic force microscopy tips
M. Al-Khafaji et al.
J. Appl. Phys., 83 (1998) 6411 |
| 2617 |
Magnetic force microscopy of avalanche dynamics in magnetic
media
Brian Walsh et al.
J. Appl. Phys., 84 (1998) 5709 |
| 2585 |
Frequency shift of a resonating cantilever in a.c. force
microscopy: towards a realistic model
P. Vairac, B. Cretin
Applied Physics A: Materials Science & Processing, 66 (1998) 7, S227-S230 |
| 2619 |
Quantification of magnetic force microscopy images using
combined electrostatic and magnetostatic imaging
R. D. Gomez, A. O. Pak, A. J. Anderson, E. R. Burke, A. J. Leyendecker,
and I. D. Mayergoyz
J. Appl. Phys., 83 (1998) 11, 6226-6228 |
| 2596 |
Optimization of lateral resolution in magnetic force microscopy
S. Porthun, L. Abelmann, S.J.L. Vellekoop, J.C. Lodder, H.J. Hug
Applied Physics A: Materials Science & Processing, 66 (1998) 7, S1185-S1189 |
| 2560 |
Force spectroscopy in noncontact mode
I.Yu. Sokolov, G.S. Henderson, F.J. Wicks
Applied Surface Science, 140 (1999) 358-361 |
| 2578 |
Phase contrast and surface energy hysteresis in tapping
mode scanning force Microscopy
R. Garcia, J.Tamayo and A. San Paulo
Surf. Interface Anal., 27 (1999) 312-316 |
| 2601 |
Force-distance curves by atomic force microscopy
B. Cappella and G. Dietler
Surf. Sci. Rep., 34 (1999) 1-3, 1-3 |
| 2611 |
Range of interactions: An experiment in atomic and magnetic
force microscopy
W. L. Murphy et al.
Am. J. Phys., 67 (1999) 905 |
| 2612 |
Quantitative determination of effective dipole and monopole
moments of magnetic force microscopy tips
J. Lohau et al.
J. Appl. Phys., 86 (1999) 3410 |
| 2614 |
Observation of the effects of tip magnetization states
on magnetic force microscopy images
Paul Rice and Stephen E. Russek
J. Appl. Phys., 85 (1999) 8, 5163-5165 |
| 2615 |
Magnetic dissipation microscopy in ambient conditions
Roger Proksch et al.
Appl. Phys. Lett., 74 (1999) 419 |
| 2561 |
Noise in piezoresistive atomic force microscopy
Ole Hansen and Anja Boisen
Nanotechnology, 10 (1999) 51-60 |
| 2604 |
A method for the calibration of magnetic force microscopy
tips
P. J. A. van Schendel, H. J. Hug, B. Stiefel, S. Martin, and H.-J. Guntherodt
J. Appl. Phys., 88 (2000) 435 |
| 2571 |
Dynamics of a vibrating tip near or in intermittent contact
with a surface
R. Garcia and A. San Paulo
Phys. Rev. B, 61 (2000) 13381(R) |
| 2605 |
Quantitative determination of the magnetization and stray
field of a single domain Co/Pt dot with magnetic force microscopy
J. Lohau et al.
Appl. Phys. Lett., 76 (2000) 3094 |
| 2558 |
Active Quality Factor Control in Liquids for Force Spectroscopy
A. D. L. Humphris, J. Tamayo, and M. J. Miles
Langmuir, 16 (2000) 7891-7894 |
| 2579 |
Higher-harmonics generation in tapping-mode atomic-force
microscopy: Insights into the tip-sample interaction
R. Hillenbrand, M. Stark, R. Guckenberger
Appl. Phys. Lett., 76 (2000) 3478-3480 |
| 2572 |
An apertureless near-field scanning optical microscope
and its application to surface-enhanced Raman spectroscopy and multiphoton
fluorescence imaging
Linda T. Nieman, Gerhard M. Krampert, and Robert E. Martinez
Rev. Sci. Instrum., 72 (2001) 3, 1691-1699 |
| 2598 |
Quantitative interpretation of magnetic force microscopy
images from soft patterned elements
J. M. Garcia et al.
Appl. Phys. Lett. 79 (2001) 656 |
| 2599 |
Calibrated magnetic force microscopy measurement of current-carrying
lines
R. Yongsunthon, J. McCoy, and E. D. Williams
J. Vac. Sci. Technol., A19 (2001) 4, 1763-1768 |
| 2603 |
Quantitative field measurements from magnetic force microscope
tips and comparison with point and extended charge models
S. McVitie, R. P. Ferrier, J. Scott, G. S. White, and A. Gallagher
J. Appl. Phys., 89 (2001) 7, 3656-3661 |
| 2562 |
Tapping mode atomic force microscopy in liquid with an
insulated piezoelectric microactuator
B. Rogers, D. York, N. Whisman, M. Jones, K. Murray, and J. D. Adams, T.
Sulchek, S. C. Minne
Rev. Sci. Instrum., 73 (2002) 9, 3242-3244 |
| 2597 |
Magnetic force gradient mapping
Tilman E. Schaffer, Manfred Radmacher, and Roger Proksch
J. Appl. Phys. 94 (2003) 10, 6525-6532 |
| 2680 |
Improved atomic force microscopy resolution using an electric
double layer
I. Yu. Sokolov, G. S. Henderson, F. J. Wicks, G. A. Ozin
Appl. Phys. Lett., 70 (1997) 7, 844-846 |
| 2703 |
The relation between resonance curves and tip-surface interaction
potential in noncontact atomic-force microscopy
Naruo Sasaki and Masaru Tsukada
Jpn. J. Appl. Phys., 37 (1998) Pt2/5A, L533-L535 |
| 2678 |
Self-oscillation mode induced in an atomic force microscope
cantilever
Kiwoong Kim and Soonchil Lee
J. Appl. Phys., 91 (2002) 7, 4715-4719 |
| 2398 |
Scanning probe microscopy
M. A. Poggi, L. A. Bottomley, P. T. Lillehei
Anal. Chem., 74 (2002) 12, 2851-2862 |
| 2708 |
Small signal amplification using parametric resonance in
NcAFM imaging
Shivprasad Patil, C.V. Dharmadhikari
Appl. Surf. Sci., 217 (2003) 7-15 |
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Theory and Practice of SPM