long scanning

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Application

Long Scanning probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 3 µm. The probes have special wear-resistant coating that increases their lifetime.
Height image of polystyrene-polybutadiene-polystyrene triblock copolymer. Scan obtained in Tapping mode using LS probe tip with radius about 30 nm. Image courtesy of S. Magonov (Veeco Instuments).

 

Probes

LS probes have a special wear-resistant coating that increases the durability. The tip shape is conical. NSC/CSC probes may have a hard hydrophobic Si3N4 coating that changes the properties of the Silicon surface. The coating also increases the tip radius.

Typical tip radius
30 nm

Tip cone angle
40°

Tip height
20..25 μm

Coating material
wear-resistant, nonconducting, amorphous

Typical tip radius
20 nm

Tip cone angle
40°

Tip height
20..25 μm

Coating material
Si3N4
Long Scanning

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.

30 nm radius
LS

20 nm radius
Si3N4 - coated Si probes
NSC/CSC
 
 

 

 

 

 
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