Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM technique.
Scans and application notes »
Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
1 nm radius multiple diamond-like tips hi'res-C
1 nm radius Tungsten spike hi'res-w
Lateral resolution down to 5 nm for scan size below 1 μm.
10 nm radius silicon tip NSC/CSC
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.
30 nm radius LS
20 nm radius Si3N4 - coated Si probes NSC/CSC
Probes with special coatings for conductive AFM modes.
25 nm radius tip Pt coated
40 nm radius tip Ti-Pt coated
50 nm radius tip Cr-Au coated
Solutions for quantitative analysis of materials properties.
Pre-measured spring constant probes -F Series
