SPM Probes   1-Lever  

16 Series, Cantilever

Options
 
Series Resonant Frequency, kHz Spring Constant, N/m Length l ± 5,
µm		 Width w ± 3,
µm		 Thickness t ± 0.5,
µm
min typ max min typ max
16-th 150 170 190 25 40 60 230 40 7.0
Application

These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.

         Scans and application notes »
Probes
Features
less than
1 nm		 Features
1-10 nm		 Features
more than
10 nm		 EFM Materials
characte-
rising
HI'RES-C
1 nm		        
HI'RES-W
1 nm		        
NSC/CSC
10 nm		        
LS
30 nm 		       
NSC/CSC
20 nm 		       
Pt        
Ti-Pt        
Cr-Au        
Calibrated
spring
constant		        
high resolution

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

1 nm radius
multiple diamond-like tips
hi'res-C

1 nm radius Tungsten spike
hi'res-w
general purpose

Lateral resolution down to 5 nm for scan size below 1 μm.

10 nm radius conical tip
NSC/CSC
long scanning

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.

30 nm radius
LS

20 nm radius
Si3N4 - coated Si probes
NSC/CSC
Conductive

Probes with special coatings for conductive AFM modes.

25 nm radius tip
Pt coated

40 nm radius tip
Ti-Pt coated

50 nm radius tip
Cr-Au coated
Materials Characterizing

Solutions for quantitative analysis of materials properties.

Pre-measured
spring constant probes
-F Series
 
 

 

 

 

 
 
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