SPM Probes   1-Lever  

17 Series, Cantilever

Options
 
Series Resonant Frequency, kHz Spring Constant, N/m Length l ± 5,
µm		 Width w ± 3,
µm		 Thickness t ± 0.5,
µm
min typ max min typ max
17-th 8.5 12 15 0.05 0.15 0.3 460 50 2.0
Application

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

         Scans and application notes »
Probes
Features
less than
1 nm		 Features
1-10 nm		 Features
more than
10 nm		 EFM Materials
characte-
rising
HI'RES-C
1 nm		        
NEW!
SCD
7 nm		        
NSC/CSC
10 nm		        
LS
30 nm 		       
NSC/CSC
20 nm 		       
Pt        
Ti-Pt        
Cr-Au        
Calibrated
spring
constant		        
high resolution

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

1 nm radius
multiple diamond-like tips
hi'res-C
general purpose

Lateral resolution down to 5 nm for scan size below 1 μm.

NEW!
7 nm radius diamond tip
SCD

7 nm radius silicon tip
NSC/CSC
long scanning

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.

30 nm radius
LS

20 nm radius
Si3N4 - coated Si probes
NSC/CSC
Conductive

Probes with special coatings for conductive AFM modes.

25 nm radius tip
Pt coated

40 nm radius tip
Ti-Pt coated

50 nm radius tip
Cr-Au coated
Materials Characterizing

Solutions for quantitative analysis of materials properties.

Pre-measured
spring constant probes
-F Series
 
 

 

 

 

 
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