SPM Probes   1-Lever  

18 Series, Cantilever

Options
 
Series Resonant Frequency, kHz Spring Constant, N/m Length l ± 5,
µm		 Width w ± 3,
µm		 Thickness t ± 0.5,
µm
min typ max min typ max
18-th 60 75 90 2.0 3.5 5.5 230 40 3.0
Application

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

         Scans and application notes »
Probes
Features
less than
1 nm		 Features
1-10 nm		 Features
more than
10 nm		 EFM MFM Materials
characte-
rising
HI'RES-C
1 nm		          
NEW!
SCD
7 nm		          
NSC/CSC
10 nm		          
LS
30 nm 		         
NSC/CSC
20 nm 		         
Pt          
Ti-Pt          
Cr-Au          
Co-Cr          
Calibrated
spring
constant		          
high resolution

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

1 nm radius
multiple diamond-like tips
hi'res-C
general purpose

Lateral resolution down to 5 nm for scan size below 1 μm.

NEW!
7 nm radius diamond tip
SCD

10 nm radius conical tip
NSC/CSC
long scanning

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.

30 nm radius
LS

20 nm radius
Si3N4 - coated Si probes
NSC/CSC
Conductive

Probes with special coatings for conductive AFM modes.

25 nm radius tip
Pt coated

40 nm radius tip
Ti-Pt coated

50 nm radius tip
Cr-Au coated
magnetic

Probes with magnetic coating for MFM.

90 nm radius magnetic tip
Co-Cr coated
Materials Characterizing

Solutions for quantitative analysis of materials properties.

Pre-measured
spring constant probes
-F Series
 
 

 

 

 

 
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