SPM Probes   High Resolution   Hi-RES-C  

DP17/Hi'RES-C

Probe
TEM images of the Hi'RES-C probe and single extratip.
HI-RES probe has a hydrophobic diamond-like extratip at the apex of silicon etched probe. In general, there are additional smaller extratips near the main one.

Typical probe tip radius
1 nm

Height of extratip
100 .. 200 nm

Total probe tip height
20..25 µm

Maximum allowed height of surface feature for scanning
< 20nm*

*Though the extratips are of different height and angle, they can contribute to imaging of rough surfaces, which result in repeating of the features in the scan.

Cantilever
SEM image of Silicon cantilever and probe. Schematic drawing of the probe chip.
Cantilever Resonant Frequency, kHz Spring Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
17 Series 8.5 12 15 0.05 0.15 0.3 460 50 2.0

ORDERING

 
Backside Al-coated.
5 chips. View price
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