SPM Probes   High Resolution   Hi-RES-W  

DP18/Hi'RES-W

Probe
SEM image of the single metal extratip of the HI'RES-W probe.
HI'RES-W probes have single tungsten spikes at the very end of silicon tip. Due to the nanometer tip curvature radius, Hi'RES-W probe provides high resolution for scans less than 200 nm in size and minimum tip-sample attraction force.

Typical probe tip radius
1 nm

Height of extratip
100 .. 500 nm

Probe material
Tungsten*

Total probe tip height
20..25 µm

*Hi'RES-W is not conducting from the chip holder to the spike.
Cantilever
SEM image of Silicon cantilever and probe. Schematic drawing of the probe chip.
Cantilever Resonant Frequency, kHz Spring Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
18 Series 60 75 90 2.0 3.5 5.5 230 40 3.0

ORDERING

 
Backside Al-coated.
5 chips. View price
15 chips. View price
 
 

 

 

 

 
 
OUR DISTRIBUTORS CONTACTS
MIKROMASCH
TOLL-FREE NUMBERS: USA: 1-866-SPMTIPS (776-8477)/ EU: + 8000-SPMTIPS (776-8477)
E-MAIL: INFO@MIKROMASCH.COM 		RUS