Probes of the DPE series has a special structure of conducting layers applied to the tip that provides better signat to noise ratio on the scans of electric properties.

Resulting tip radius with the coating
35 nm

Full tip cone angle*
40°

Total tip height
20..25 µm

Probe bulk material
n-type silicon (phosphorus doped).

*The full cone angle may be less than 40° at the last 200 nm of the tip end.