SPM Probes   Conductive  

DPE

Options
Probe
TEM micrograph of the DPE probe tip end  

Probes of the DPE series has a special structure of conducting layers applied to the tip that provides better signal to noise ratio on the scans of electric properties.

Resulting tip radius with the coating
30 nm

Full tip cone angle*
40°

Total tip height
10..15 µm

Probe material
Si

Material of the tip
Pt-coated

*The full cone angle may be less than 40° at the last 200 nm of the tip end.
Application

DPE probes have increased coating thickness, which gives more freedom for using them in contact electrical modes. The probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The probes can be used in electric AC modes when a study of the electric properties of a sample has higher priority. This is demonstrated in AM-FM images of a fluoroalkane layer.

         Scans and application notes »
Cantilevers
Cantilever Resonant Frequency,
kHz		 Spring Constant,
N/m
min typical max mintypicalmax
15 Series 265 325 400 25 45 70
16 Series 150 170 190 25 45 70
14 Series 110 160 200 2 6 12
18 Series 50 65 80 2.0 3.5 5.0
17 Series 9 12 15 0.1 0.15 0.3
1-lever

325 kHz (40 N/m)

15 Series

170 kHz (40 N/m)

16 Series

160 kHz (5 N/m)

14 Series

75 kHz (3.5 N/m)

18 Series

12 kHz (0.15 N/m)

17 Series
 
 

 

 

 

 
 
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