Conducting DPE probe
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| Application note |
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Among the serious limitations of Electrical Force Microscopy are
the sensitivity and signal to noise ratio. Enlargement of the probe
tip radius leads to a loss of resolution in both topography and EFM imaging,
while it does not always reduce the noise in the maps of electric properties.
The novel DPE probe consists of a special structure of conductive
layers, which provides a more stable electrical signal and less
noise through some reduction of resolution in the topography image though.
Topography, surface potential and dC/dz scans of a fluoroalkane
(F12H20) on a Si substrate are presented in Fig. 1. below. As you
see the resolution in topography image made using Pt-coated probe
(a) is better because the 6.5 nm lamellar structures are clearly resolved
and the shape of brighter features is not as rounded as in the image
made with the DPE probe(b). Still the better signal-to-noise peformance
is provided by the DPE probe (d,f). |
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(a) Topography image,
Pt coated probe |
(b) Topography image,
DPE probe |
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(c) Surface potential map
and cross-section,
Pt coated probe |
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(d) Surface potential map
and cross-section,
DPE probe |
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(c) dC/dz map and cross-section,
Pt coated probe |
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(d) dC/dz map and cross-section,
DPE probe |
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| Comparison of AM-FM scans (5kHz-10kHz)
of a fluoroalkane layer made using regular Pt coated probe and DPE
probe. Scan size 350 nm. DPE probe provides better signal-to-noise
performance, while the topography resolution is better with Pt-coated
probe. Image courtesy of Sergei Magonov, Agilent Technologies (Agilent
5500 AFM). |
| Cantilever |
Resonant Frequency, kHz |
Spring Constant, N/m |
| min |
typical |
max |
min | typical | max |
| 15 Series |
265 |
325 |
400 |
20 |
40 |
75 |
| 16 Series |
150 |
170 |
190 |
25 |
40 |
60 |
| 14 Series |
110 |
160 |
220 |
1.8 |
5 |
12.5 |
| 18 Series |
75 |
100 |
125 |
2.0 |
3.5 |
5.5 |
| 19 Series |
50 |
80 |
113 |
0.17 |
0.65 |
1.7 |
| 17 Series |
8.5 |
12 |
15 |
0.05 |
0.15 |
0.3 |
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