SPM Probes   Conductive  

DPER

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Probe
SEM image of the DPER probe tip end  

The DPER probes are made by depositing a thin metal coating on Si tips. While the thickness of the coating on the flat cantilever surface is about 15 nm, there is only slight 4-5 nm increase of the tip di- mensions compared to the bare Si probes. The tip radius of each DPER probe is individually controlled on SEM and is guaranteed to be below 20 nm.

Resulting tip radius with the coating
15 nm

Full tip cone angle*
30°

Total tip height
10..15 µm

Probe material
Si

Material of the tip
Pt-coated

Application

Cantilever tip is coated by continuous 15 nm Pt film. The probes can be used for imaging samples with higher resolution in XY directions. Due to the thin coating, the electrical signal may be noisy. One should also not expect the coating stability in contact or hard tapping regimes of AFM operation.

         Scans and application notes »
Cantilevers
Cantilever Resonant Frequency,
kHz		 Spring Constant,
N/m
min typical max mintypicalmax
15 Series 265 325 400 25 45 70
16 Series 150 170 190 25 45 70
14 Series 110 160 200 2 6 12
18 Series 50 65 80 2.0 3.5 5.0
17 Series 9 12 15 0.1 0.15 0.3
1-lever

325 kHz (40 N/m)

15 Series

170 kHz (40 N/m)

16 Series

160 kHz (5 N/m)

14 Series

75 kHz (3.5 N/m)

18 Series

12 kHz (0.15 N/m)

17 Series
 
 

 

 

 

 
 
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