GP is a single-crystal Silicon AFM probe
with tetrahedral tip. The tip is inclined and located at the very
end of the cantilever for easier positioning of the tip into the area
of interest using video camera.
Typical probe tip radius
10 nm
Tip inclination angle
19.5°
Tip aspect ratio
more than 3:1 (4:1 typical)
Tip height
15±2.5 µm
Probe material
p-type silicon (boron doped)
Probe bulk resistivity*
0.01..0.05 Ohm*cm
*The surface of Silicon has a native oxide layer
that makes the probe nonconducting. The thickness of the native
oxide film is 1..4 nm.
|
