SPM Probes   High Resolution  

Hi'RES-C

Options
Probe
TEM images of the Hi'RES-C probe and single extratip.
HI-RES probe has a hydrophobic diamond-like extratip at the apex of silicon etched probe. In general, there are additional smaller extratips near the main one.

Typical probe tip radius
1 nm

Height of extratip
100 .. 200 nm

Total probe tip height
20..25 µm

Maximum allowed height of surface feature for scanning
< 20nm*

*Though the extratips are of different height and angle, they can contribute to imaging of rough surfaces, which result in repeating of the features in the scan.
Application

Hi'RES-C probe suffers less contamination than Silicon SPM probe and provides obtaining many high-resolution scans, while it requires special care in use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

Advantages of Hi'RES-C are noticeable when scanning smaller areas (<250 nm) and flat samples (Ra<1 nm). On larger images, the resolution is similar to those by general purpose probes. Not for corrugated samples.

         Scans and application notes ?»
Cantilevers
Cantilever Resonant Frequency,
kHz		 Spring Constant,
N/m
min typical max mintypical max
15 Series 265 325 400 20 40 75
16 Series 150 170 190 25 40 60
14 Series 110 160 220 1.8 5 12.5
18 Series 75 100 125 2.0 3.5 5.5
19 Series 50 80 113 0.17 0.65 1.7
17 Series 8.5 12 15 0.05 0.15 0.3
1-lever

325 kHz (40 N/m)

15 Series

170 kHz (40 N/m)

16 Series

160 kHz (5 N/m)

14 Series

80 kHz (0.6 N/m)

19 Series

75 kHz (3.5 N/m)

18 Series

12 kHz (0.15 N/m)

17 Series
 
 

 

 

 

 
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