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Diamond probe

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Dear SPM users,

Unfortunately, MikroMasch has had some difficulties with the production of our Single Crystal Diamond probes. It is our goal to develop our SCD probes in such a way as to provide a high quality imaging experience at a reasonable price.

We have had good test results and a good batch of test probes. However, we have met some obstacles in the production process which keep us from producing the required quantity of probes at this time.

Please accept my deepest apologies for the serious delay of our probes for you. Our team is strongly focused on adjusting the production process to provide both a well priced and excellently performing diamond tip. We plan to finish production development in the first half of 2010 and will immediately inform you about our results and provide samples for your testing.

Again, I apologize for the delay and thank you for your understanding and patience.

Sincerely yours,

Denis Shabratov
President of MikroMasch


SCD probe
SEM image of the single crystal Diamond (SCD) probe tip.
The probe tip is a single crystal diamond pyramid, which is mounted on silicon cantilever. The technology of growing diamond provides tips having a high aspect ratio apex with cone angle less than 20° over the top 100 - 200 nm. The probe is not conducting, chemically inert.

Typical probe tip radius
7 nm

Tip cone angle
20°

Tip height
5 - 10 µm

Probe material
diamond

Wide range of cantilevers of different spring constants and resonant frequencies are available for topography imaging of different samples in various AFM modes and ambient conditions.

Application

Diamond is a promising tip material due to its outstanding hardness and chemical stability. The tip exhibits high durability and resistance to wear. A number of scans of rough and hard surfaces can be obtained by the same diamond tip even in contact mode without changing the tip shape, which is important for imaging of evolution of surface topography during different processes in time. The sharp tip end and the small cone angle allow imaging of the high aspect ratio surface features.

         Scans and application notes »

Cantilevers
Cantilever Resonant Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
Series 14 110 160 220 1.5 5.0 12.5
Series 15 250 300 350 20 40 75
Series 17 8.5 12 15 0.05 0.15 0.3
Series 18 75 100 125 2.0 3.5 5.5
Series 19 50 80 115 0.17 0.6 1.7
1-lever

300 kHz (40 N/m)

Series 15

160 kHz (5.0 N/m)

Series 14

100 kHz (3.5 N/m)

Series 18

80 kHz (0.63 N/m)

Series 19

12 kHz (0.15 N/m)

Series 17

 
 

 

 

 

 
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MIKROMASCH

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E-MAIL: INFO@MIKROMASCH.COM