SPM Probes   Materials Characterizing  

nanoTWIST

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Cantilever
TEM image of the nanoTWIST probe and cantilever. Schematic drawing of the nanoTWIST cantilever.

The nanoTWIST probe is a T-shaped cantilever having a tip on one of its arms. The positioning of the tip on one of the arms of the probe enhances its torsional motion when the tip interacts with the sample in the contact or oscillatory modes.

Typical tip height
5 µm

Full tip cone angle less than
40°

Tip radius
10 nm

Application

Cantilevers with torsional sensitivity provide force spectroscopy imaging in tapping mode for mapping of local adhesion and elastic modulus. The probe has a tip that is offset from the long axis of the cantilever. The materials properties can be calculated from the torsional harmonic signal.

         Scans and application notes »

Cantilever Series Cantilever Length, l±5µm Cantilever Width, w±3µm Cantilever Thickness, µm Spring Constant, N/m Resonant Frequency, kHz Ftr/Ffl*
TL01 180 20 2.0 2.0 90 10±0.5
TL02 300 20 5.0 3.0 60 17±0.5
* Ratio of torsional to flexural resonance frequencies
TL-lever

90 kHz (Ftr/Ffl=10)

TL01

60 kHz (Ftr/Ffl=17)

TL02

 
 

 

 

 

 
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