Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
1 nm radius multiple diamond-like tips hi'res-C
1 nm radius Tungsten spike hi'res-w
Lateral resolution down to 5 nm for scan size below 1 μm.
10 nm radius silicon tip NSC/CSC
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 3 μm at 512 points.
30 nm radius LS
20 nm radius Si3N4 - coated Si probes NSC/CSC
Solutions for quantitative analysis of materials properties.
Torsional cantilevers TL Series
Pre-measured spring constant probes -F Series
Tipless cantilevers 12 Series
Probes with special coatings for conductive AFM modes.
35 nm radius tip DPE low-noise probe
25 nm radius tip Pt coated
40 nm radius tip Ti-Pt coated
50 nm radius tip Cr-Au coated
Probes with magnetic coating for MFM.
90 nm radius magnetic tip Co-Cr coated
325 kHz (40 N/m)
15 Series
170 kHz (40 N/m)
16 Series
160 kHz (5 N/m)
14 Series
80 kHz (0.6 N/m)
19 Series
75 kHz (3.5 N/m)
18 Series
12 kHz (0.15 N/m)
17 Series
150..320 kHz(5..15 N/m)
NSC35
70..150 kHz(0.6..1.8 N/m)
NSC36
20..40 kHz(0.3..0.6 N/m)
CSC37
20..40 kHz(0.03..0.08 N/m)
CSC38
330 kHz (48 N/m)60 kHz (3.0 N/m)
NSC11
210 kHz (17 N/m)25 kHz (1.0 N/m)
NSC21
155 kHz (6.0 N/m)28 kHz (0.35 N/m)
CSC11
105 kHz (2.0 N/m)12 kHz (0.12 N/m)
CSC21
