PA series

SEM image of the PA01 surface

Sample for characterization of tip shape with hard sharp pyramidal nanostructures. The pyramids are triangular with base length in the range 50 – 100 nm and height 50 – 150 nm. The radius of curvature of the sharpest edges is below 5 nm.

The structures of the PA01 are covered by a highly wear-resistant layer.


Part number Pyramid base, nm Pyramid height, nm Smallest edge radii, nm Active area, mm x mm Chip dimensions, mm x mm
PA01 50 - 100 50 - 150 < 5 5 x 5 5 x 5 x 0.3

PA01 specifications

Application

The exact shape of the scanning probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the tip.


An AFM image of the PA structures is shown below. The AFM image is obtained using a HQ:NSC15/Al BS probe with a long scanning DLC coated tip.


 AFM image of the PA01 surface. Scan taken with HQ:NSC15/Hard/Al BS probe with tip radius Rc < 20 nm. Scan size 1 x 1 µm2, scan height 160 nm.

ORDERING OPTIONS

PA01 (AFM tip characterization sample)


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