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4XC-GG
Probe
- 8 nm
- < 30 nm
- 12 - 16 µm
- n-type silicon
- Gold
- Gold
-
High Speed Scanning with the OPUS 4XC 1.2MHz Cantilever
on High Speed Scanning with the OPUS 4XC 1.2MHz cantilever compared to the 4XC 150 kHz general purpose cantilever, presented by Dr. Penka Terziyska, Product Manager
www.spmtips.com -
Introduction to the OPUS SPM Probes
Introduction to the OPUS SPM Probes, presented by Dr. Penka Terziyska, Product Manager
www.spmtips.com -
Introduction to the OPUS SPM Probes
Introduction to the OPUS SPM Probes, presented by Dr. Penka Terziyska, Product Manager
www.spmtips.com
Cantilever
| 4XC-GG, Cantilevers |
Resonance Frequency, kHz | Force Constant, N/m |
Length
l ± 5, µm |
Width
w ± 3, µm |
Thickness
t ± 0.5, µm |
||||
|---|---|---|---|---|---|---|---|---|---|
| min | typ | max | min | typ | max | ||||
| Contact mode cantilever | 11 | 17 | 22 | 0.1 | 0.3 | 0.6 | 500 | 30 | 3 |
| Soft AC mode cantilever | 50 | 75 | 100 | 0.75 | 2.5 | 5.3 | 240 | 30 | 3 |
| Standard AC mode cantilever | 100 | 150 | 200 | 2.8 | 9 | 21 | 175 | 40 | 3 |
| High frequency AC mode cantilever | 650 | 1200 | 1850 | 35 | 100 | 215 | 65 | 31 | 3 |
