Lateral resolution down to
5 nm for scan size below 1 μm.
11 series
XSC11, Cantilevers |
Resonance Frequency, kHz | Force Constant, N/m |
Length
l ± 5, µm |
Width
w ± 3, µm |
Thickness
t ± 0.5, µm |
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min | typ | max | min | typ | max | ||||
Cantilever A | 12 | 15 | 18 | 0.1 | 0.2 | 0.4 | 500 | 30 | 2.7 |
Cantilever B | 60 | 80 | 100 | 1.1 | 2.7 | 5.6 | 210 | 30 | 2.7 |
Cantilever C | 115 | 155 | 200 | 3 | 7 | 16 | 150 | 30 | 2.7 |
Cantilever D | 250 | 350 | 465 | 17 | 42 | 90 | 100 | 50 | 2.7 |
Application
Each cantilever is similar with respect to resonance frequency and force constant to the cantilever of a very popular 1-lever product: HQ:CSC17, HQ:NSC18, HQ:NSC14 and HQ:NSC15. Probes with 4 different cantilevers in terms of resonance frequency and force constant allow on-the-fly selection or correction of the desired mode of operation. Measurement modes ranging from contact mode operation through force modulation and lift mode to tapping and noncontact mode are possible.
Features 1-10 nm | Features > 10 nm | EFM | |
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HQ:XSC11/Al BS |
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HQ:XSC11/No Al |
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HQ:XSC11/Hard/Al BS |
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HQ:XSC11/Pt |
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HQ:DPE-XSC11 |
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HQ:DPER-XSC11 |
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HQ:DMD-XSC11 |
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ORDERING OPTIONS
Click on a product type below to order online.LONG SCANNING
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
