11 series

XSC11,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 12 15 18 0.1 0.2 0.4 500 30 2.7
Cantilever B 60 80 100 1.1 2.7 5.6 210 30 2.7
Cantilever C 115 155 200 3 7 16 150 30 2.7
Cantilever D 250 350 465 17 42 90 100 50 2.7

Application

Each cantilever is similar with respect to resonance frequency and force constant to the cantilever of a very popular 1-lever product: HQ:CSC17, HQ:NSC18, HQ:NSC14 and HQ:NSC15. Probes with 4 different cantilevers in terms of resonance frequency and force constant allow on-the-fly selection or correction of the desired mode of operation. Measurement modes ranging from contact mode operation through force modulation and lift mode to tapping and noncontact mode are possible.


Features 1-10 nm Features > 10 nm EFM
HQ:XSC11/Al BS
HQ:XSC11/No Al
HQ:XSC11/Hard/Al BS
HQ:XSC11/Pt
HQ:DPE-XSC11
HQ:DPER-XSC11

ORDERING OPTIONS

Click on a product type below to order online.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

CONDUCTIVE

Probes with special coatings for conductive AFM modes.