Lateral resolution down to
5 nm for scan size below 1 μm.
16 series
| Cantilever | Resonance Frequency, kHz | Force Constant, N/m |
Length
l ± 5, µm |
Width
w ± 3, µm |
Thickness
t ± 0.5, µm |
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|---|---|---|---|---|---|---|---|---|---|
| min | typ | max | min | typ | max | ||||
| 16 Series | 170 | 190 | 210 | 30 | 45 | 70 | 225 | 37.5 | 7.0 |
Application
These cantilevers with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM systems that have a low-frequency feedback loop. These cantilevers also fit SPMs that do not support probes with short lever arms.Scans and application notes
| Features 1-10 nm | Features > 10 nm | EFM | |
|---|---|---|---|
| HQ:NSC16/Al BS |
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| HQ:NSC16/No Al |
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| HQ:NSC16/Hard/Al BS |
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| HQ:NSC16/Cr-Au |
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ORDERING OPTIONS
Click on a product type below to order online.
LONG SCANNING
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
