|Cantilever||Resonance Frequency, kHz||Force Constant, N/m||
l ± 5,
w ± 3,
t ± 0.5,
ApplicationCantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.
Scans and application notes
|Features < 1 nm||Features 1-10 nm||Features > 10 nm||EFM||MFM|
|HQ:NSC18/Hard/ Al BS|
ORDERING OPTIONSClick on a product type below to order online.
Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.