4-lever series


These probes feature four cantilevers and tips, two on each side of the chip. Series 11 probes have four different silicon beam cantilevers with silicon rotated pyramidal tips. Series 12 probes have two pairs of different silicon nitride triangular cantilevers with silicon nitride square pyramidal tips.   


Probes with 4 cantilevers are used for various purposes. For more information about the applications of each series please select it fron the menu to the right.

Scans and application notes


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