HQ:NSC15/No Al
Standard Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
Coating
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm) | Full Cone Angle 40° | Radius < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 40 N/m(20 - 80 N/m) | Res. Freq. 325 kHz(265 - 410 kHz) | Length 125 µm(120 - 130µm) | Width 30 µm(27 - 33µm) | Thickness 4 µm(3.5 - 4.5 µm) |
All typical values
