Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°.
AFM Probe Specifications
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 0.8 N/m(0.3 - 2 N/m)*||Res. Freq. 40 kHz(30 - 55 kHz)*||Length 250 µm(1 - 255µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever B||Shape Beam||Force Const. 0.3 N/m(0.1 - 0.6 N/m)*||Res. Freq. 20 kHz(15 - 30 kHz)*||Length 350 µm(1 - 355µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever C||Shape Beam||Force Const. 0.4 N/m(0.1 - 1 N/m)*||Res. Freq. 30 kHz(20 - 40 kHz)*||Length 300 µm(1 - 305µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
* typical values