Hi'Res-C15/Cr-Au

High Resolution, Tapping Mode AFM Probe


The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.

AFM probes of the HQ:NSC15 series have AFM cantilevers with high stability in tapping mode and non-contact mode operation.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.

Coating

Reflective Gold

AFM Probe Specifications
AFM Tip
Shape Height Radius
Shape Supersharp Height 15 µm (12 - 18 µm)* Radius < 1 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 40 N/m(20 - 80 N/m)* Res. Freq. 325 kHz(265 - 410 kHz)* Length 125 µm(1 - 130µm)* Width 30 µm(27 - 33µm)* Thickness 4µm(3.5 - 4.5 µm)*

* typical values

Packages Price
HiRes-C15/Cr-Au-5 5 pcs * 495 USD
495 USD
* Total: 0 USD
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