High Resolution, Soft Tapping Mode AFM Probe
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC18 series series are suitable for soft tapping and Lift mode operation AFM, Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
|Shape Supersharp||Height 15 µm (12 - 18 µm)*||Radius < 1 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 2.8 N/m(1.2 - 5.5 N/m)*||Res. Freq. 75 kHz(60 - 90 kHz)*||Length 225 µm(1 - 230µm)*||Width 27.5 µm(24.5 - 30.5µm)*||Thickness 3µm(2.5 - 3.5 µm)*|
* typical values